Inventor · disambiguated record
Alain Stephen Dekker
Also filed as: DEKKER ALAIN · DEKKER ALAIN STEPHEN
2 granted patents·1 pending application·1 citations·filing 2008–2008
30Inventor score
Top patents by PatentIndex Score
3 records- 0131US8712107B2X-ray imagingKAINE CHRISTOPHER JAMES·Filed 2008·Granted Apr 29, 2014·1 cites·20 claims
- 0228US2010246930A1Inspection apparatus and method using penetrating radiationILLINOIS TOOL WORKS·Filed 2008·Application pending·0 cites
- 0325US8447562B2Inspection apparatus and method using penetrating radiationDEKKER ALAIN·Filed 2008·Granted May 21, 2013·0 cites·11 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →