Inventor · disambiguated record
Wan-Chun Pan
Also filed as: PAN WAN-CHUN
10 granted patents·4 pending applications·41 citations·filing 2012–2024
84Inventor score
Top patents by PatentIndex Score
14 records- 0195US8889497B2Semiconductor devices and methods of manufacture thereofTAIWAN SEMICONDUCTOR MFG·Filed 2012·Granted Nov 18, 2014·22 cites·20 claims
- 0289US9592585B2System and method for CMP station cleanlinessTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2012·Granted Mar 14, 2017·8 cites·12 claims
- 0387US9048087B2Methods for wet clean of oxide layers over epitaxial layersTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted Jun 2, 2015·8 cites·20 claims
- 0483US2024387187A1Methods for reducing scratch defects in chemical mechanical planarizationTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 0581US12030159B2Chemical mechanical planarization toolTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Jul 9, 2024·0 cites·20 claims
- 0679US2023377898A1Methods for reducing scratch defects in chemical mechanical planarizationTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Application pending·0 cites
- 0772US10522365B2Methods for reducing scratch defects in chemical mechanical planarizationTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Dec 31, 2019·1 cites·20 claims
- 0869US9153657B2Semiconductor devices comprising a finTAIWAN SEMICONDUCTOR MFG·Filed 2014·Granted Oct 6, 2015·2 cites·20 claims
- 0968US11712778B2Chemical mechanical planarization toolTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Aug 1, 2023·0 cites·20 claims
- 1061US2020126803A1Methods for Reducing Scratch Defects in Chemical Mechanical PlanarizationTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Application pending·0 cites
- 1155US2024429312A1High-k isolation of fin structuresTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Application pending·0 cites
- 1245US8853083B2Chemical mechanical polish in the growth of semiconductor regionsTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted Oct 7, 2014·0 cites·20 claims
- 1344US9508716B2Methods of manufacturing a semiconductor deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2013·Granted Nov 29, 2016·0 cites·20 claims
- 1444US9064959B2Method and apparatus for forming a CMOS deviceTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted Jun 23, 2015·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →