Inventor · disambiguated record
Quintino L. Trianni
Also filed as: TRIANNI QUINTINO L · TRIANNI QUINTINO LORENZO
14 granted patents·20 citations·filing 2012–2020
87Inventor score
Top patents by PatentIndex Score
14 records- 0188US9977053B2Wafer probe alignmentIBM·Filed 2016·Granted May 22, 2018·4 cites·10 claims
- 0287US8535956B2Chip attach frameECKERT MARTIN·Filed 2012·Granted Sep 17, 2013·7 cites·6 claims
- 0382US11262381B2Device for positioning a semiconductor die in a wafer proberIBM·Filed 2020·Granted Mar 1, 2022·2 cites·18 claims
- 0481US9885748B2Module testing utilizing wafer probe test equipmentIBM·Filed 2015·Granted Feb 6, 2018·2 cites·18 claims
- 0579US9927463B2Wafer probe alignmentIBM·Filed 2015·Granted Mar 27, 2018·2 cites·10 claims
- 0677US9496188B2Soldering three dimensional integrated circuitsIBM·Filed 2015·Granted Nov 15, 2016·3 cites·19 claims
- 0757US10056346B2Chip attach frameIBM·Filed 2017·Granted Aug 21, 2018·0 cites·5 claims
- 0856US9891272B2Module testing utilizing wafer probe test equipmentIBM·Filed 2015·Granted Feb 13, 2018·0 cites·9 claims
- 0956US9686895B2Chip attach frameIBM·Filed 2013·Granted Jun 20, 2017·0 cites·6 claims
- 1052US9250289B2System for electrical testing and manufacturing of a 3-D chip stack and methodIBM·Filed 2013·Granted Feb 2, 2016·0 cites·13 claims
- 1147US10114069B2Method for electrical testing of a 3-D chip stackIBM·Filed 2015·Granted Oct 30, 2018·0 cites·4 claims
- 1246US10684930B2Functional testing of high-speed serial linksIBM·Filed 2017·Granted Jun 16, 2020·0 cites·20 claims
- 1345US9921268B2Auto-alignment of backer plate for direct docking test boardsIBM·Filed 2015·Granted Mar 20, 2018·0 cites·20 claims
- 1434US9726719B2Semiconductor automatic test equipmentIBM·Filed 2015·Granted Aug 8, 2017·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →