Inventor · disambiguated record
Kazunori Kanebako
Also filed as: KANEBAKO KAZUNORI
20 granted patents·1 pending application·275 citations·filing 1990–2015
95Inventor score
Top patents by PatentIndex Score
21 records- 0195US7349249B2Semiconductor memory deviceTOSHIBA KK·Filed 2006·Granted Mar 25, 2008·45 cites·20 claims
- 0292US7813171B2Semiconductor memory deviceTOSHIBA KK·Filed 2006·Granted Oct 12, 2010·28 cites·17 claims
- 0392US7317636B2Nonvolatile semiconductor memory, a data write-in method for the nonvolatile semiconductor memory and a memory cardTOSHIBA KK·Filed 2005·Granted Jan 8, 2008·45 cites·17 claims
- 0488US8270214B2Nonvolatile semiconductor memory deviceSHIBATA NOBORU·Filed 2010·Granted Sep 18, 2012·10 cites·4 claims
- 0582US9665426B2Semiconductor device and reading methodTOSHIBA KK·Filed 2015·Granted May 30, 2017·4 cites·5 claims
- 0680US8116134B2Semiconductor memory device with improved ECC efficiencySHIBATA NOBORU·Filed 2008·Granted Feb 14, 2012·10 cites·14 claims
- 0775US8687420B2Nonvolatile semiconductor memory deviceSHIBATA NOBORU·Filed 2012·Granted Apr 1, 2014·4 cites·6 claims
- 0870US8406054B2Semiconductor memory device with improved ECC efficiencySHIBATA NOBORU·Filed 2012·Granted Mar 26, 2013·3 cites·9 claims
- 0970US8379445B2Semiconductor storage device capable of reducing erasure timeTOSHIBA KK·Filed 2010·Granted Feb 19, 2013·4 cites·23 claims
- 1070US5278078AMethod of manufacturing semiconductor deviceTOSHIBA KK·Filed 1992·Granted Jan 11, 1994·35 cites·20 claims
- 1156US7046555B2Methods for identifying non-volatile memory elements with poor subthreshold slope or weak transconductanceTOSHIBA KK·Filed 2003·Granted May 16, 2006·7 cites·37 claims
- 1255US5364805AMethod of manufacturing an EEPROM having an erasing gate electrodeTOSHIBA KK·Filed 1991·Granted Nov 15, 1994·17 cites·4 claims
- 1349US5386381AMask read only memory (ROM) for storing multi-value dataTOSHIBA KK·Filed 1993·Granted Jan 31, 1995·11 cites·4 claims
- 1449US5374847ANonvolatile semiconductor memory device having a passivation filmTOSHIBA KK·Filed 1992·Granted Dec 20, 1994·19 cites·16 claims
- 1548US7414894B2Methods for identifying non-volatile memory elements with poor subthreshold slope or weak transconductanceSANDISK CORP·Filed 2006·Granted Aug 19, 2008·1 cites·3 claims
- 1648US5556800AMethod of manufacturing a mask read only memory (ROM) for storing multi-value dataTOSHIBA KK·Filed 1994·Granted Sep 17, 1996·10 cites·3 claims
- 1745US5252846ASemiconductor memory device with an improved erroneous write characteristic and erasure characteristicTOSHIBA KK·Filed 1992·Granted Oct 12, 1993·11 cites·8 claims
- 1841US5094971AMethod of manufacturing a read only semiconductor memory deviceTOSHIBA KK·Filed 1990·Granted Mar 10, 1992·10 cites·10 claims
- 1939US8379444B2Semiconductor memory device capable of accurate reading even when erasure level changesTOSHIBA KK·Filed 2010·Granted Feb 19, 2013·0 cites·14 claims
- 2033US2002093084A1Semiconductor device protecting a semiconductor chip mounted over a substrate with a molding formed by an injection molding methodFiled 2001·Application pending·0 cites
- 2118US5169797AManufacturing method for semiconductor storage deviceTOSHIBA KK·Filed 1991·Granted Dec 8, 1992·1 cites·3 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →