Inventor · disambiguated record
Fumitoshi Hatori
Also filed as: HATORI FUMITOSHI
13 granted patents·481 citations·filing 1993–2020
92Inventor score
Top patents by PatentIndex Score
13 records- 0197US5498978AField programmable gate arrayTOSHIBA KK·Filed 1994·Granted Mar 12, 1996·279 cites·8 claims
- 0288US8395410B2Semiconductor integrated circuit and system of controlling the sameHATORI FUMITOSHI·Filed 2011·Granted Mar 12, 2013·14 cites·20 claims
- 0388US5459342AField programmable gate array with spare circuit blockTOSHIBA KK·Filed 1993·Granted Oct 17, 1995·54 cites·10 claims
- 0478US6252452B1Semiconductor deviceTOSHIBA KK·Filed 1999·Granted Jun 26, 2001·32 cites·18 claims
- 0577US7417489B2Semiconductor integrated circuit having controller controlling the change rate of power voltageTOSHIBA KK·Filed 2006·Granted Aug 26, 2008·11 cites·14 claims
- 0676US6546048B1Pulse width modulation waveform generating circuitTOSHIBA KK·Filed 1999·Granted Apr 8, 2003·36 cites·22 claims
- 0772US7236035B2Semiconductor device adapted to minimize clock skewTOSHIBA KK·Filed 2004·Granted Jun 26, 2007·17 cites·19 claims
- 0862US5539331AField programmable gate array having transmission gates and semiconductor integrated circuit for programming connection of wiresTOSHIBA KK·Filed 1994·Granted Jul 23, 1996·17 cites·10 claims
- 0961US7487370B2Semiconductor device and systemTOSHIBA KK·Filed 2005·Granted Feb 3, 2009·2 cites·2 claims
- 1054US11304163B2Wireless communication apparatus and wireless communication systemTOSHIBA KK·Filed 2020·Granted Apr 12, 2022·0 cites·6 claims
- 1148US5764588AMemory circuitTOSHIBA KK·Filed 1997·Granted Jun 9, 1998·11 cites·10 claims
- 1244US9602384B2Semiconductor integrated circuit and test method thereofTOSHIBA KK·Filed 2014·Granted Mar 21, 2017·0 cites·5 claims
- 1341US5550771AProgrammable semiconductor integrated circuitTOSHIBA KK·Filed 1995·Granted Aug 27, 1996·8 cites·22 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →