Inventor · disambiguated record
Krzysztof Kozaczek
Also filed as: KOZACZEK KRZYSZTOF · KOZACZEK KRZYSZTOF J
5 granted patents·96 citations·filing 1999–2009
81Inventor score
Top patents by PatentIndex Score
5 records- 0192US7983394B2Multiple wavelength X-ray sourceMOXTEK INC·Filed 2009·Granted Jul 19, 2011·25 cites·21 claims
- 0279US6678347B1Method and apparatus for quantitative phase analysis of textured polycrystalline materialsHYPERNEX INC·Filed 2002·Granted Jan 13, 2004·20 cites·21 claims
- 0372US6301330B1Apparatus and method for texture analysis on semiconductor wafersHYPERNEX INC·Filed 1999·Granted Oct 9, 2001·44 cites·40 claims
- 0462US6792075B2Method and apparatus for thin film thickness mappingHYPERNEX INC·Filed 2002·Granted Sep 14, 2004·4 cites·24 claims
- 0547US6909772B2Method and apparatus for thin film thickness mappingIBM·Filed 2003·Granted Jun 21, 2005·3 cites·34 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →