Inventor · disambiguated record
Yih-Jau Chang
Also filed as: CHANG YIH-JAU
14 granted patents·263 citations·filing 1983–2010
93Inventor score
Files withUNITED MICROELECTRONICS CORP8CHANG YIH-JAU3POWERCHIP SEMICONDUCTOR CORP2STORAGE TECHNOLOGY PARTNERS1
Top patents by PatentIndex Score
14 records- 0190US8063444B2Lateral diffused metal oxide semiconductor (LDMOS) devices with electrostatic discharge (ESD) protection capability in integrated circuitCHANG YIH-JAU·Filed 2009·Granted Nov 22, 2011·25 cites·22 claims
- 0287US8154078B2Semiconductor structure and fabrication method thereofCHANG YIH-JAU·Filed 2010·Granted Apr 10, 2012·12 cites·28 claims
- 0382US8252652B2Semiconductor structure and fabrication method thereofCHANG YIH-JAU·Filed 2010·Granted Aug 28, 2012·11 cites·17 claims
- 0478US5670397ADual poly-gate deep submicron CMOS with buried contact technologyPOWERCHIP SEMICONDUCTOR CORP·Filed 1997·Granted Sep 23, 1997·45 cites·21 claims
- 0571US6114226AMethod of manufacturing electrostatic discharge protective circuitUNITED MICROELECTRONICS CORP·Filed 1999·Granted Sep 5, 2000·32 cites·19 claims
- 0669US6150261AMethod of fabricating semiconductor device for preventing antenna effectUNITED MICROELECTRONICS CORP·Filed 1999·Granted Nov 21, 2000·39 cites·11 claims
- 0765US5723373AMethod of making porous-Si capacitors for high density drams cellPOWERCHIP SEMICONDUCTOR CORP·Filed 1996·Granted Mar 3, 1998·25 cites·31 claims
- 0861US4478679ASelf-aligning process for placing a barrier metal over the source and drain regions of MOS semiconductorsSTORAGE TECHNOLOGY PARTNERS·Filed 1983·Granted Oct 23, 1984·27 cites·9 claims
- 0958US6040222AMethod for fabricating an electrostatistic discharge protection device to protect an integrated circuitUNITED MICROELECTRONICS CORP·Filed 1999·Granted Mar 21, 2000·18 cites·8 claims
- 1048US6319850B1Method of forming dielectric layer with low dielectric constantUNITED MICROELECTRONICS CORP·Filed 1999·Granted Nov 20, 2001·13 cites·19 claims
- 1144US6225166B1Method of manufacturing electrostatic discharge protective circuitUNITED MICROELECTRONICS CORP·Filed 1999·Granted May 1, 2001·8 cites·17 claims
- 1237US6110841AMethod for avoiding plasma damageUNITED MICROELECTRONICS CORP·Filed 1999·Granted Aug 29, 2000·6 cites·14 claims
- 1331US6274494B1Method of protecting gate oxideUNITED MICROELECTRONICS CORP·Filed 1998·Granted Aug 14, 2001·1 cites·16 claims
- 1430US6255809B1Method for measuring capacitance of passive device regionUNITED MICROELECTRONICS CORP·Filed 1999·Granted Jul 3, 2001·1 cites·4 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →