Inventor · disambiguated record
Stephen F. Meier
Also filed as: MEIER STEPHEN F · MEIER STEPHEN FRANK
15 granted patents·3 pending applications·586 citations·filing 1995–2016
95Inventor score
Top patents by PatentIndex Score
18 records- 0196US8473875B2Method and system for forming high accuracy patterns using charged particle beam lithographyFUJIMURA AKIRA·Filed 2011·Granted Jun 25, 2013·39 cites·16 claims
- 0293US9057956B2Method and system for design of enhanced edge slope patterns for charged particle beam lithographyFUJIMURA AKIRA·Filed 2011·Granted Jun 16, 2015·9 cites·24 claims
- 0391US9043734B2Method and system for forming high accuracy patterns using charged particle beam lithographyD2S INC·Filed 2013·Granted May 26, 2015·13 cites·8 claims
- 0490US6345379B1Method and apparatus for estimating internal power consumption of an electronic circuit represented as netlistSYNOPSYS INC·Filed 1999·Granted Feb 5, 2002·123 cites·2 claims
- 0589US9612530B2Method and system for design of enhanced edge slope patterns for charged particle beam lithographyD2S INC·Filed 2016·Granted Apr 4, 2017·4 cites·16 claims
- 0687US5696694AMethod and apparatus for estimating internal power consumption of an electronic circuit represented as netlistSYNOPSYS INC·Filed 1995·Granted Dec 9, 1997·114 cites·32 claims
- 0785US6075932AMethod and apparatus for estimating internal power consumption of an electronic circuit represented as netlistSYNOPSYS INC·Filed 1997·Granted Jun 13, 2000·93 cites·10 claims
- 0885US5668732AMethod for estimating power consumption of a cyclic sequential electronic circuitSYNOPSYS INC·Filed 1995·Granted Sep 16, 1997·96 cites·28 claims
- 0977US7929235B2Method and system for distinguishing spatial and thermal defects on perpendicular mediaMRA TEK LLC·Filed 2009·Granted Apr 19, 2011·8 cites·10 claims
- 1077US5682320AMethod for electronic memory management during estimation of average power consumption of an electronic circuitSYNOPSYS INC·Filed 1995·Granted Oct 28, 1997·60 cites·25 claims
- 1172US8369038B2Method and system for distinguishing spatial and thermal defects on perpendicular mediaMRA TEK LLC·Filed 2011·Granted Feb 5, 2013·2 cites·17 claims
- 1269US7532422B2Method and system for distinguishing spatial and thermal defects on perpendicular mediaMRA TEK LLC·Filed 2006·Granted May 12, 2009·3 cites·11 claims
- 1368US6714017B2Method and system for infrared detection of electrical short defectsCANDESCENT TECH CORP·Filed 2000·Granted Mar 30, 2004·13 cites·44 claims
- 1450US7630154B2Hard disk inspection method and systemMRA TEK LLC·Filed 2006·Granted Dec 8, 2009·0 cites·16 claims
- 1550US5872664ADistortion of an isolated pulsePHASE METRICS INC·Filed 1996·Granted Feb 16, 1999·9 cites·24 claims
- 1649US2015338737A1Method and System for Design of Enhanced Edge Slope Patterns for Charged Particle Beam LithographyD2S INC·Filed 2015·Application pending·0 cites
- 1747US2013252143A1Method and system for design of enhanced accuracy patterns for charged particle beam lithographyD2S INC·Filed 2013·Application pending·0 cites
- 1838US2012221980A1Method and system for design of enhanced accuracy patterns for charged particle beam lithographyFUJIMURA AKIRA·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →