Inventor · disambiguated record
John Leonard Wall
Also filed as: WALL JOHN · WALL JOHN LEONARD
9 granted patents·176 citations·filing 2000–2019
88Inventor score
Files withBRUKER JV ISRAEL LTD2JORDAN VALLEY SEMICONDUCTORS LTD2BEDE SCIENT INSTR LTD1BRUKER TECH LTD1JORDAN VALLEY SEMICONDUCTORS1
Top patents by PatentIndex Score
9 records- 0193US8437450B2Fast measurement of X-ray diffraction from tilted layersWALL JOHN·Filed 2010·Granted May 7, 2013·23 cites·16 claims
- 0293US6778633B1Method and apparatus for prolonging the life of an X-ray targetBEDE SCIENT INSTR LTD·Filed 2000·Granted Aug 17, 2004·102 cites·12 claims
- 0392US9748070B1X-ray tube anodeJORDAN VALLEY SEMICONDUCTORS LTD·Filed 2015·Granted Aug 29, 2017·11 cites·16 claims
- 0492US9726624B2Using multiple sources/detectors for high-throughput X-ray topography measurementJORDAN VALLEY SEMICONDUCTORS LTD·Filed 2015·Granted Aug 8, 2017·7 cites·14 claims
- 0590US10816487B2Image contrast in X-ray topography imaging for defect inspectionBRUKER JV ISRAEL LTD·Filed 2019·Granted Oct 27, 2020·13 cites·18 claims
- 0690US9269468B2X-ray beam conditioningJORDAN VALLEY SEMICONDUCTORS·Filed 2013·Granted Feb 23, 2016·11 cites·9 claims
- 0785US8781070B2Detection of wafer-edge defectsWORMINGTON MATTHEW·Filed 2012·Granted Jul 15, 2014·7 cites·20 claims
- 0880US9852875B2X-ray tubeBRUKER JV ISRAEL LTD·Filed 2017·Granted Dec 26, 2017·2 cites·6 claims
- 0954US11302508B2X-ray tubeBRUKER TECH LTD·Filed 2019·Granted Apr 12, 2022·0 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →