Inventor · disambiguated record
Mikio Naruse
Also filed as: NARUSE MIKIO
9 granted patents·3 pending applications·272 citations·filing 1981–2011
90Inventor score
Files withJEOL LTD5NISSAN MOTOR2DOW CORNING TORAY CO LTD1MATSUSHITA ELECTRIC INDUSTRIAL CO LTD1NARUSE MIKIO1
Top patents by PatentIndex Score
12 records- 0189US5907157AMethod and apparatus for preparing specimenJEOL LTD·Filed 1997·Granted May 25, 1999·100 cites·18 claims
- 0288US5406087ASpecimen-holding device for electron microscopePROTEIN ENGINEERING RESEARCH I·Filed 1994·Granted Apr 11, 1995·73 cites·5 claims
- 0382US7095024B2TEM sample equipped with an identifying function, focused ion beam device for processing TEM sample, and transmission electron microscopeJEOL LTD·Filed 2004·Granted Aug 22, 2006·22 cites·9 claims
- 0480US7196413B2Heat dissipation assembly and method for producing the sameDOW CORNING TORAY CO LTD·Filed 2005·Granted Mar 27, 2007·12 cites·10 claims
- 0580US4434452AMetallized film capacitorMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1981·Granted Feb 28, 1984·35 cites·12 claims
- 0664US7081670B2Insulation sheet and apparatus utilizing the sameNISSAN MOTOR·Filed 2004·Granted Jul 25, 2006·13 cites·20 claims
- 0751US5264705ASpecimen-driving apparatus for electron microscope which tilts and translates while preventing contact damageJEOL LTD·Filed 1992·Granted Nov 23, 1993·12 cites·3 claims
- 0840US9247677B2Electronic component casingNARUSE MIKIO·Filed 2011·Granted Jan 26, 2016·0 cites·8 claims
- 0940US5289005AElectron microscopeJEOL LTD·Filed 1992·Granted Feb 22, 1994·5 cites·7 claims
- 1040US2006138633A1Semiconductor deviceNISSAN MOTOR·Filed 2005·Application pending·0 cites
- 1138US2004113075A1Transmission electron microscopeJEOL LTD·Filed 2003·Application pending·0 cites
- 1233US2013175703A1Semiconductor device and method of manufacturing semiconductor deviceTAKARAGI SHINICHI·Filed 2011·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Mikio Naruse files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →