Inventor · disambiguated record
Thomas E. Tiwald
Also filed as: TIWALD THOMAS E
21 granted patents·1 pending application·131 citations·filing 2001–2017
94Inventor score
Top patents by PatentIndex Score
22 records- 0191US10073120B1Integrated vacuum-ultraviolet, mid and near-ultraviolet, visible, near, mid and far infrared and terahertz optical hall effect (OHE) instrument, and method of useJ A WOOLLAM CO INC·Filed 2017·Granted Sep 11, 2018·7 cites·26 claims
- 0291US9851294B1Integrated mid-infrared, far infrared and terahertz optical Hall effect (OHE) instrument, and method of useJ A WOOLLAM CO INC·Filed 2015·Granted Dec 26, 2017·9 cites·39 claims
- 0386US8531665B1Small volume cellPFEIFFER GALEN L·Filed 2010·Granted Sep 10, 2013·6 cites·6 claims
- 0484US7817266B2Small volume cellJ A WOOLLAM CO INC·Filed 2008·Granted Oct 19, 2010·7 cites·11 claims
- 0581US9599569B2Method to enhance sensitivity to surface normal optical functions of anisotropic films using attenuated total reflectionJ A WOOLLAM CO INC·Filed 2016·Granted Mar 21, 2017·2 cites·30 claims
- 0681US8493565B1Small volume cellPFEIFFER GALEN L·Filed 2012·Granted Jul 23, 2013·4 cites·12 claims
- 0779US7385697B2Sample analysis methodology utilizing electromagnetic radiationJ A WOOLLAM CO INC·Filed 2004·Granted Jun 10, 2008·19 cites·25 claims
- 0878US7623237B1Sample investigating systemJ A WOOLLAM CO INC·Filed 2006·Granted Nov 24, 2009·5 cites·11 claims
- 0978US7265839B1Horizontal attenuated total reflection systemJ A WOOLLAM CO INC·Filed 2006·Granted Sep 4, 2007·6 cites·4 claims
- 1077US8130375B1Small volume cellPFEIFFER GALEN L·Filed 2009·Granted Mar 6, 2012·5 cites·11 claims
- 1175US7349092B1System for reducing stress induced effects during determination of fluid optical constantsJ A WOOLLAM CO INC·Filed 2005·Granted Mar 25, 2008·4 cites·18 claims
- 1274US7110912B1Method of applying parametric oscillators to model dielectric functionsJ A WOOLLAM CO INC·Filed 2004·Granted Sep 19, 2006·12 cites·41 claims
- 1372US7636161B1Back surface reflection reduction systems and methodologyJ A WOOLLAM CO INC·Filed 2007·Granted Dec 22, 2009·3 cites·20 claims
- 1472US6801312B1Method for evaluating complex refractive indicies utilizing IR range ellipsometryJ A WOOLLAM CO INC·Filed 2001·Granted Oct 5, 2004·17 cites·27 claims
- 1569US6738139B1Method of determining bulk refractive indicies of fluids from thin films thereofJ A WOOLLAM CO INC·Filed 2003·Granted May 18, 2004·7 cites·8 claims
- 1668US7283234B1Use of ellipsometry and surface plasmon resonance in monitoring thin film deposition or removal from a substrate surfaceJ A WOOLLAM CO INC·Filed 2004·Granted Oct 16, 2007·7 cites·19 claims
- 1766US6455853B2Determination of thickness and impurity profiles in thin membranes utilizing spectorscopic data obtained from ellipsometric investigation of both front and back surfacesJ A WOOLLAM CO INC·Filed 2001·Granted Sep 24, 2002·6 cites·3 claims
- 1864US7777883B2Ellipsometric investigation of anisotropic samplesJ A WOOLLAM CO INC·Filed 2008·Granted Aug 17, 2010·1 cites·15 claims
- 1961US7187443B1Method of determining bulk refractive indicies of liquids from thin films thereofJ A WOOLLAM CO INC·Filed 2004·Granted Mar 6, 2007·3 cites·16 claims
- 2056US7193709B1Ellipsometric investigation of thin filmsJ A WOOLLAM CO INC·Filed 2004·Granted Mar 20, 2007·1 cites·6 claims
- 2153US8159672B1Sample investigating system and method of useLIPHARDT MARTIN M·Filed 2009·Granted Apr 17, 2012·0 cites·13 claims
- 2238US2014356520A1Method to enhance sensitivity to surface-normal optical functions of anisotropic films using attenuated total reflectionJ A WOOLLAM CO INC·Filed 2014·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →