Inventor · disambiguated record
Joseph C. Sher
Also filed as: SHER JOSEPH · SHER JOSEPH C
58 granted patents·1 pending application·1,259 citations·filing 1995–2017
99Inventor score
Files withMICRON TECHNOLOGY INC59
Top patents by PatentIndex Score
59 records- 0196US6154851AMemory repairMICRON TECHNOLOGY INC·Filed 1997·Granted Nov 28, 2000·138 cites·40 claims
- 0296US5578941AVoltage compensating CMOS input buffer circuitMICRON TECHNOLOGY INC·Filed 1995·Granted Nov 26, 1996·108 cites·24 claims
- 0394US5977763ACircuit and method for measuring and forcing an internal voltage of an integrated circuitMICRON TECHNOLOGY INC·Filed 1996·Granted Nov 2, 1999·101 cites·12 claims
- 0490US5689213APost-fabrication programmable integrated circuit ring oscillatorMICRON TECHNOLOGY INC·Filed 1995·Granted Nov 18, 1997·88 cites·37 claims
- 0589US6504396B2Method for adjusting an output slew rate of a bufferMICRON TECHNOLOGY INC·Filed 2001·Granted Jan 7, 2003·30 cites·9 claims
- 0688US6459634B1Circuits and methods for testing memory cells along a periphery of a memory arrayMICRON TECHNOLOGY INC·Filed 2000·Granted Oct 1, 2002·45 cites·65 claims
- 0786US6930503B2System for testing integrated circuit devicesMICRON TECHNOLOGY INC·Filed 2004·Granted Aug 16, 2005·28 cites·40 claims
- 0885US6496027B1System for testing integrated circuit devicesMICRON TECHNOLOGY INC·Filed 1997·Granted Dec 17, 2002·50 cites·23 claims
- 0982US6756805B2System for testing integrated circuit devicesMICRON TECHNOLOGY INC·Filed 2002·Granted Jun 29, 2004·23 cites·24 claims
- 1080US6055191AMethod and apparatus for leakage blockingMICRON TECHNOLOGY INC·Filed 1999·Granted Apr 25, 2000·45 cites·19 claims
- 1180US5654860AWell resistor for ESD protection of CMOS circuitsMICRON TECHNOLOGY INC·Filed 1995·Granted Aug 5, 1997·35 cites·28 claims
- 1277US11093588B2Memory system including data obfuscationMICRON TECHNOLOGY INC·Filed 2017·Granted Aug 17, 2021·2 cites·25 claims
- 1375US5844298AMethod and apparatus for programming anti-fusesMICRON TECHNOLOGY INC·Filed 1997·Granted Dec 1, 1998·36 cites·23 claims
- 1472US5815429AAntifuse programming method and apparatusMICRON TECHNOLOGY INC·Filed 1997·Granted Sep 29, 1998·25 cites·17 claims
- 1571US5896041AMethod and apparatus for programming anti-fuses using internally generated programming voltageMICRON TECHNOLOGY INC·Filed 1996·Granted Apr 20, 1999·30 cites·19 claims
- 1670US6449207B2Voltage independent fuse circuit and methodMICRON TECHNOLOGY INC·Filed 2001·Granted Sep 10, 2002·18 cites·22 claims
- 1769US5767552AStructure for ESD protection in semiconductor chipsMICRON TECHNOLOGY INC·Filed 1997·Granted Jun 16, 1998·25 cites·19 claims
- 1868US5973900AHigh voltage protection for an integrated circuit input bufferMICRON TECHNOLOGY INC·Filed 1997·Granted Oct 26, 1999·26 cites·22 claims
- 1967US5880917AWell resistor for ESD protection of CMOS circuitsMICRON TECHNOLOGY INC·Filed 1997·Granted Mar 9, 1999·20 cites·28 claims
- 2066US5905401ADevice and method for limiting the extent to which circuits in integrated circuit dice electrically load bond pads and other circuit nodes in the diceMICRON TECHNOLOGY INC·Filed 1996·Granted May 18, 1999·23 cites·36 claims
- 2165US6266291B1Voltage independent fuse circuit and methodMICRON TECHNOLOGY INC·Filed 1999·Granted Jul 24, 2001·24 cites·26 claims
- 2265US5668751AAntifuse programming method and apparatusMICRON TECHNOLOGY INC·Filed 1996·Granted Sep 16, 1997·19 cites·24 claims
- 2364US6300788B1Buffer with adjustable slew rate and a method of providing an adjustable slew rateMICRON TECHNOLOGY INC·Filed 2000·Granted Oct 9, 2001·8 cites·17 claims
- 2463US6445644B2Apparatus and method for generating a clock within a semiconductor device and devices and systems including sameMICRON TECHNOLOGY INC·Filed 2000·Granted Sep 3, 2002·12 cites·36 claims
- 2562US6633196B2Device and method for limiting the extent to which circuits in integrated circuit dice electrically load bond pads and other circuit nodes in the diceMICRON TECHNOLOGY INC·Filed 2002·Granted Oct 14, 2003·7 cites·31 claims
- 2661US6137664AWell resistor for ESD protection of CMOS circuitsMICRON TECHNOLOGY INC·Filed 1999·Granted Oct 24, 2000·15 cites·60 claims
- 2761US6009029ACircuit and method for antifuse stress testMICRON TECHNOLOGY INC·Filed 1998·Granted Dec 28, 1999·16 cites·30 claims
- 2858US6351180B1Clamp circuit with fuse optionsMICRON TECHNOLOGY INC·Filed 1999·Granted Feb 26, 2002·13 cites·21 claims
- 2956US6157204ABuffer with adjustable slew rate and a method of providing an adjustable slew rateMICRON TECHNOLOGY INC·Filed 1998·Granted Dec 5, 2000·10 cites·17 claims
- 3056US5848010ACircuit and method for antifuse stress testMICRON TECHNOLOGY INC·Filed 1997·Granted Dec 8, 1998·13 cites·23 claims
- 3156US5802009AVoltage compensating output driver circuitMICRON TECHNOLOGY INC·Filed 1997·Granted Sep 1, 1998·13 cites·29 claims
- 3256US5666067AVoltage compensating CMOS input buffer circuitMICRON TECHNOLOGY INC·Filed 1996·Granted Sep 9, 1997·10 cites·13 claims
- 3355US5949725AMethod and apparatus for reprogramming a supervoltage circuitMICRON TECHNOLOGY INC·Filed 1997·Granted Sep 7, 1999·15 cites·43 claims
- 3454US5712575ASuper-voltage circuit with a fast resetMICRON TECHNOLOGY INC·Filed 1995·Granted Jan 27, 1998·15 cites·19 claims
- 3554US5555166ASelf-timing power-up circuitMICRON TECHNOLOGY INC·Filed 1995·Granted Sep 10, 1996·19 cites·15 claims
- 3653US5793224AVoltage generator for antifuse programmingMICRON TECHNOLOGY INC·Filed 1996·Granted Aug 11, 1998·13 cites·18 claims
- 3752US6229296B1Circuit and method for measuring and forcing an internal voltage of an integrated circuitMICRON TECHNOLOGY INC·Filed 1997·Granted May 8, 2001·15 cites·16 claims
- 3852US6169704B1Apparatus and method for generating a clock within a semiconductor device and devices and systems including sameMICRON TECHNOLOGY INC·Filed 1998·Granted Jan 2, 2001·13 cites·37 claims
- 3952US5841714ASupervoltage circuitMICRON TECHNOLOGY INC·Filed 1996·Granted Nov 24, 1998·15 cites·21 claims
- 4050US5914898AMemory device and system with leakage blocking circuitryMICRON TECHNOLOGY INC·Filed 1997·Granted Jun 22, 1999·12 cites·7 claims
- 4149US6242335B1Method for fabricating isolated anti-fuse structureMICRON TECHNOLOGY INC·Filed 1999·Granted Jun 5, 2001·12 cites·20 claims
- 4247US6417721B2Device and method for limiting the extent to which circuits in integrated circuit dice electrically load bond pads and other circuit nodes in the diceMICRON TECHNOLOGY INC·Filed 2001·Granted Jul 9, 2002·1 cites·31 claims
- 4345US5691887ASelf-timing power-up circuitMICRON TECHNOLOGY INC·Filed 1996·Granted Nov 25, 1997·11 cites·24 claims
- 4444US6242969B1Local substrate pumping in integrated circuitsMICRON TECHNOLOGY INC·Filed 1997·Granted Jun 5, 2001·7 cites·18 claims
- 4544US5940320AVoltage compensating output driver circuitMICRON TECHNOLOGY INC·Filed 1998·Granted Aug 17, 1999·7 cites·22 claims
- 4642US7468623B2Clamp circuit with fuse optionsMICRON TECHNOLOGY INC·Filed 2001·Granted Dec 23, 2008·2 cites·22 claims
- 4742US6885238B2Clamp circuit with fuse optionsMICRON TECHNOLOGY INC·Filed 2003·Granted Apr 26, 2005·2 cites·13 claims
- 4842US6140692AIsolated anti-fuse structure and method for fabricating sameMICRON TECHNOLOGY INC·Filed 1997·Granted Oct 31, 2000·8 cites·31 claims
- 4941US6946863B1Circuit and method for measuring and forcing an internal voltage of an integrated circuitMICRON TECHNOLOGY INC·Filed 2000·Granted Sep 20, 2005·2 cites·55 claims
- 5041US6117696ACircuit and method for measuring and forcing an internal voltage of an integrated circuitMICRON TECHNOLOGY INC·Filed 1998·Granted Sep 12, 2000·7 cites·22 claims
Showing the top 50 of 59 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →