Inventor · disambiguated record
Ho-Hyung Jung
Also filed as: JUNG HO-HYUNG
5 granted patents·3 pending applications·15 citations·filing 2002–2016
71Inventor score
Top patents by PatentIndex Score
8 records- 0173US9543179B2Load port moduleSAMSUNG ELECTRONICS CO LTD·Filed 2014·Granted Jan 10, 2017·5 cites·10 claims
- 0268US6779410B2Sample holder and auxiliary apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2002·Granted Aug 24, 2004·9 cites·24 claims
- 0358US8898028B2Non-pattern wafer inspection deviceKIM BYEONG-CHEOL·Filed 2010·Granted Nov 25, 2014·1 cites·19 claims
- 0445US2004237670A1Sample holder and auxiliary apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2004·Application pending·0 cites
- 0541US9716047B2Method of measuring a substrate and method of manufacturing a semiconductor device using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted Jul 25, 2017·0 cites·20 claims
- 0641US2005111004A1Specimen inspection apparatus and reference value setting unit and method of the specimen inspection apparatusFiled 2004·Application pending·0 cites
- 0736US9543151B2Ionizer and substrate transfer system having the same, and method of manufacturing a semiconductor device using the sameLEE JAE-WOOK·Filed 2015·Granted Jan 10, 2017·0 cites·20 claims
- 0832US2016099086A1Substrate transfer system having ionizerLEE JAE-WOOK·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →