Inventor · disambiguated record
Nobuhiro Nagura
Also filed as: NAGURA NOBUHIRO
4 granted patents·1 pending application·33 citations·filing 1997–2018
73Inventor score
Top patents by PatentIndex Score
5 records- 0194US9559183B2Semiconductor device with varying thickness of insulating film between electrode and gate electrode and method of manufacturing semiconductor deviceRENESAS ELECTRONICS CORP·Filed 2014·Granted Jan 31, 2017·14 cites·12 claims
- 0285US9984884B2Method of manufacturing semiconductor device with a multi-layered gate dielectricRENESAS ELECTRONICS CORP·Filed 2016·Granted May 29, 2018·3 cites·3 claims
- 0359US10410868B2Semiconductor device and method of manufacturing semiconductor deviceRENESAS ELECTRONICS CORP·Filed 2018·Granted Sep 10, 2019·0 cites·4 claims
- 0451US5965928ASemiconductor device with MOS capacitor and fabrication method thereofNEC CORP·Filed 1997·Granted Oct 12, 1999·16 cites·11 claims
- 0537US2006193977A1CMOS device featuring high breakdown voltage without failure in enhancing integration thereof, and method for manufacturing such CMOS deviceNEC ELECTRONICS CORP·Filed 2006·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →