Inventor · disambiguated record
Kazunori Nemoto
Also filed as: NEMOTO KAZUNORI
5 granted patents·3 pending applications·100 citations·filing 1999–2020
79Inventor score
Top patents by PatentIndex Score
8 records- 0188US8595666B2Semiconductor defect classifying method, semiconductor defect classifying apparatus, and semiconductor defect classifying programHAYAKAWA KOICHI·Filed 2010·Granted Nov 26, 2013·10 cites·24 claims
- 0283US6611728B1Inspection system and method for manufacturing electronic devices using the inspection systemHITACHI LTD·Filed 1999·Granted Aug 26, 2003·71 cites·17 claims
- 0379US8831899B2Inspecting apparatus and an inspecting methodNEMOTO KAZUNORI·Filed 2009·Granted Sep 9, 2014·9 cites·30 claims
- 0471US6539272B1Electric device inspection method and electric device inspection systemHITACHI LTD·Filed 2000·Granted Mar 25, 2003·10 cites·5 claims
- 0551US11808807B2Semiconductor integrated circuit device and inspection method for semiconductor integrated circuit deviceHITACHI ASTEMO LTD·Filed 2020·Granted Nov 7, 2023·0 cites·13 claims
- 0637US2004063263A1Manufacturing method of semiconductor devicesFiled 2003·Application pending·0 cites
- 0737US2004262265A1Wet processing apparatus, wet processing method and manufacturing method of semiconductor deviceTRECENTI TECHNOLOGIES INC·Filed 2004·Application pending·0 cites
- 0836US2005233554A1Manufacturing method for semiconductor device and semiconductor manufacturing apparatusTSUGA TOSHIHITO·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →