Inventor · disambiguated record
Masato Sakao
Also filed as: SAKAO MASATO
20 granted patents·483 citations·filing 1989–2002
96Inventor score
Top patents by PatentIndex Score
20 records- 0192US5798544ASemiconductor memory device having trench isolation regions and bit lines formed thereoverNEC CORP·Filed 1994·Granted Aug 25, 1998·105 cites·8 claims
- 0286US5940702AMethod for forming a cylindrical stacked capacitor in a semiconductor deviceNEC CORP·Filed 1995·Granted Aug 17, 1999·58 cites·8 claims
- 0382US5084419AMethod of manufacturing semiconductor device using chemical-mechanical polishingNEC CORP·Filed 1989·Granted Jan 28, 1992·61 cites·4 claims
- 0479US5508222AFabrication process for semiconductor deviceNEC CORP·Filed 1994·Granted Apr 16, 1996·40 cites·11 claims
- 0577US5759889AMethod for manufacturing semiconductor device incorporating DRAM section and logic circuit sectionNEC CORP·Filed 1996·Granted Jun 2, 1998·37 cites·10 claims
- 0674US6483194B2Semiconductor device having capacitor and method thereofNEC CORP·Filed 2001·Granted Nov 19, 2002·21 cites·9 claims
- 0768US6350647B2Semiconductor memory device and manufacturing method of the sameNEC CORP·Filed 2001·Granted Feb 26, 2002·14 cites·5 claims
- 0865US6031262ASemiconductor memory device having capacitor-over-bitline cell with multiple cylindrical storage electrode offset from node contact and process of fabrication thereofNEC CORP·Filed 1997·Granted Feb 29, 2000·25 cites·20 claims
- 0961US6696720B2Semiconductor device having stacked capacitor and protection elementNEC ELECTRONICS CORP·Filed 2002·Granted Feb 24, 2004·9 cites·11 claims
- 1057US5463236ASemiconductor memory device having improved isolation structure among memory cellsNEC CORP·Filed 1994·Granted Oct 31, 1995·17 cites·8 claims
- 1156US5728616AMethod of making a semiconductor memory device with improved capacitorNEC CORP·Filed 1996·Granted Mar 17, 1998·13 cites·3 claims
- 1255US5698467AMethod of manufacturing an insulation layer having a flat surfaceNEC CORP·Filed 1996·Granted Dec 16, 1997·20 cites·7 claims
- 1354US5466964ASemiconductor device capable of increasing reliabilityNEC CORP·Filed 1993·Granted Nov 14, 1995·14 cites·3 claims
- 1453US6184584B1Miniaturized contact in semiconductor substrate and method for forming the sameNEC CORP·Filed 1999·Granted Feb 6, 2001·18 cites·10 claims
- 1547US5652446ASemiconductor memory device with improved capacitorNEC CORP·Filed 1995·Granted Jul 29, 1997·8 cites·6 claims
- 1642US6387752B1Semiconductor memory device and method of fabricating the sameNEC CORP·Filed 1999·Granted May 14, 2002·7 cites·7 claims
- 1741US6229170B1Semiconductor memory cellNEC CORP·Filed 1999·Granted May 8, 2001·8 cites·6 claims
- 1836US5548157ASemiconductor device capable of increasing reliabilityNEC CORP·Filed 1995·Granted Aug 20, 1996·4 cites·1 claims
- 1935US6166425ASemiconductor device having a resistance element with a reduced areaNEC CORP·Filed 1998·Granted Dec 26, 2000·4 cites·14 claims
- 2030US6022773AMethod of making a semiconductor deviceNEC CORP·Filed 1997·Granted Feb 8, 2000·0 cites·24 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →