Inventor · disambiguated record
Daisuke Katagiri
Also filed as: KATAGIRI DAISUKE
9 granted patents·5 pending applications·15 citations·filing 2002–2022
78Inventor score
Top patents by PatentIndex Score
14 records- 0173US6777997B2Semiconductor integrated circuit and a burn-in method thereofRENESAS TECH CORP·Filed 2002·Granted Aug 17, 2004·14 cites·11 claims
- 0252US12338825B2Bearing structure, compressor, and refrigeration cycle apparatus with foreign matter separatorMITSUBISHI ELECTRIC CORP·Filed 2022·Granted Jun 24, 2025·0 cites·9 claims
- 0348US12397989B2Article storage facilityDAIFUKU KK·Filed 2021·Granted Aug 26, 2025·0 cites·6 claims
- 0448US12391473B2Article storage facilityDAIFUKU KK·Filed 2021·Granted Aug 19, 2025·0 cites·10 claims
- 0548US12110189B2Article transport facilityDAIFUKU KK·Filed 2021·Granted Oct 8, 2024·0 cites·7 claims
- 0648US10915120B2Semiconductor device and semiconductor device control methodsRENESAS ELECTRONICS CORP·Filed 2019·Granted Feb 9, 2021·0 cites·14 claims
- 0748US9889656B2Channel substrate, method of producing channel substrate, liquid discharge head, ink cartridge, and liquid discharge apparatusKATAGIRI DAISUKE·Filed 2016·Granted Feb 13, 2018·0 cites·12 claims
- 0845US11557370B2Semiconductor device and self-diagnostic method of semiconductor deviceRENESAS ELECTRONICS CORP·Filed 2021·Granted Jan 17, 2023·0 cites·10 claims
- 0943US7109779B2Semiconductor integrated circuit and a burn-in method thereofNORTHERN JAPAN SEMICONDUCTOR T·Filed 2005·Granted Sep 19, 2006·1 cites·4 claims
- 1040US2023221337A1Method for testing aggravation risk of person infected with novel coronavirus, test kit therefor, companion diagnostic drug and aggravation risk marker thereofNAT CENTER FOR GLOBAL HEALTH AND MEDICINE·Filed 2020·Application pending·0 cites
- 1137US2012250292A1Display panel unit, display panel module and display deviceMICHIMORI ATSUSHI·Filed 2010·Application pending·0 cites
- 1233US2004222837A1Semiconductor integrated circuit and a burn-in method thereofRENESAS TECH CORP·Filed 2004·Application pending·0 cites
- 1332US2003137337A1Semiconductor integrated circuit and a burn-in method thereofHITACHI LTD·Filed 2003·Application pending·0 cites
- 1427US2005206427A1Semiconductor integrated circuit deviceRENESAS NTHN JP SEMICONDUCTOR·Filed 2004·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →