Inventor · disambiguated record
Andrei Brunfeld
Also filed as: BRUNFELD ANDREI
22 granted patents·4 pending applications·444 citations·filing 1991–2011
96Inventor score
Files withXYRATEX TECH LTD8BROWN & SHARPE SURFACE INSPECT4BRUNFELD ANDREI3BLUESHIFT BIOTECHNOLOGIES INC2DISPLAY INSPECTION SYSTEMS INC2
Top patents by PatentIndex Score
26 records- 0190US7214932B2Resonator method and system for distinguishing characteristics of surface features or contaminantsXYRATEX TECH LTD·Filed 2005·Granted May 8, 2007·17 cites·21 claims
- 0289US6294793B1High speed optical inspection apparatus for a transparent disk using gaussian distribution analysis and method thereforBROWN & SHARPE SURFACE INSPECT·Filed 1992·Granted Sep 25, 2001·100 cites·101 claims
- 0388US7330277B2Resonant ellipsometer and method for determining ellipsometric parameters of a surfaceXYRATEX TECH LTD·Filed 2005·Granted Feb 12, 2008·14 cites·21 claims
- 0488US6879421B2Method and system for performing swept-wavelength measurements within an optical system incorporating a reference resonatorBEYOND 3 INC·Filed 2004·Granted Apr 12, 2005·40 cites·22 claims
- 0588US6629772B2Method and apparatus for illumination and entertainment by light emitted from a guide via scatteringFiled 2001·Granted Oct 7, 2003·38 cites·18 claims
- 0685US7253891B2Method and apparatus for simultaneous 2-D and topographical inspectionORBOTECH LTD·Filed 2004·Granted Aug 7, 2007·29 cites·29 claims
- 0784US7671978B2Scatterometer-interferometer and method for detecting and distinguishing characteristics of surface artifactsXYRATEX TECH LTD·Filed 2007·Granted Mar 2, 2010·9 cites·36 claims
- 0882US7576862B2Measuring time dependent fluorescenceBLUESHIFT BIOTECHNOLOGIES INC·Filed 2004·Granted Aug 18, 2009·21 cites·63 claims
- 0977US7102740B2Method and system for determining surface feature characteristics using slit detectorsXYRATEX TECH LTD·Filed 2003·Granted Sep 5, 2006·14 cites·19 claims
- 1075US7170605B2Active sensor and method for optical illumination and detectionCROMWELL EVAN FRANCIS·Filed 2003·Granted Jan 30, 2007·30 cites·33 claims
- 1170US7812956B2Time dependent fluorescence measurementsBLUESHIFT BIOTECHNOLOGIES INC·Filed 2008·Granted Oct 12, 2010·5 cites·62 claims
- 1270US7193725B2Method and system for optical measurement via a resonator having a non-uniform phase profileXYRATEX TECH LTD·Filed 2004·Granted Mar 20, 2007·12 cites·19 claims
- 1369US7022978B2Method and apparatus including in-resonator imaging lens for improving resolution of a resonator-enhanced optical systemXYRATEX TECH LTD·Filed 2003·Granted Apr 4, 2006·14 cites·28 claims
- 1467US7220955B2Three-dimensional imaging resonator and method thereforXYRATEX TECH LTD·Filed 2005·Granted May 22, 2007·5 cites·20 claims
- 1562US6262432B1High speed surface inspection optical apparatus for a reflective disk using gaussian distribution analysis and method thereforBROWN & SHARPE SURFACE INSPECT·Filed 1992·Granted Jul 17, 2001·27 cites·96 claims
- 1660US8436997B2Optical inspection system with polarization isolation of detection system reflectionsBRUNFELD ANDREI·Filed 2010·Granted May 7, 2013·2 cites·20 claims
- 1758US5459576ADifferential phase contrast inspection systemDISPLAY INSPECTION SYSTEMS INC·Filed 1994·Granted Oct 17, 1995·23 cites·17 claims
- 1855US6252242B1High speed optical inspection apparatus using Gaussian distribution analysis and method thereforeBROWN & SHARPE SURFACE INSPECT·Filed 1992·Granted Jun 26, 2001·20 cites·107 claims
- 1947US5189489AInterferometric measurement device with non stabilized light sourceAMSYS LTD·Filed 1991·Granted Feb 23, 1993·14 cites·12 claims
- 2046US2005157308A1Apparatus and method for measuring thickness variation of wax filmFiled 2004·Application pending·0 cites
- 2145US7294825B2Fabry-perot resonator apparatus and method including an in-resonator polarizing elementXYRATEX TECH LTD·Filed 2005·Granted Nov 13, 2007·0 cites·22 claims
- 2242US2012008135A1Fluorescence-detecting disk inspection systemTOKER GREGORY·Filed 2011·Application pending·0 cites
- 2339US5638175ADifferential phase contrast inspection system with multiple detectorsDISPLAY INSPECTION SYSTEMS INC·Filed 1995·Granted Jun 10, 1997·9 cites·13 claims
- 2435US2012057154A1Optical measuring system with matched collection lens and detector light guideBRUNFELD ANDREI·Filed 2010·Application pending·0 cites
- 2532US2012057172A1Optical measuring system with illumination provided through a void in a collecting lensBRUNFELD ANDREI·Filed 2010·Application pending·0 cites
- 2627US6255666B1High speed optical inspection apparatus for a large transparent flat panel using gaussian distribution analysis and method thereforBROWN & SHARPE SURFACE INSPECT·Filed 1992·Granted Jul 3, 2001·1 cites·75 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →