Inventor · disambiguated record
Seiichiro Higashi
Also filed as: HIGASHI SEIICHIRO
19 granted patents·1 pending application·346 citations·filing 1996–2015
95Inventor score
Top patents by PatentIndex Score
20 records- 0195US7940244B2Liquid crystal display device, driving method for liquid crystal display devices, and inspection method for liquid crystal display devicesSEIKO EPSON CORP·Filed 2006·Granted May 10, 2011·14 cites·13 claims
- 0295US7932886B2Liquid crystal display device, driving method for liquid crystal display devices, and inspection for liquid crystal display devicesSEIKO EPSON CORP·Filed 2006·Granted Apr 26, 2011·14 cites·9 claims
- 0393US6136632AActive matrix substrate, method of producing an active matrix substrate, liquid crystal display device, and electronic equipmentSEIKO EPSON CORP·Filed 1996·Granted Oct 24, 2000·128 cites·24 claims
- 0490US6023260ALiquid crystal display device, driving method for liquid crystal display devices, and inspection method for liquid crystal display devicesSEIKO EPSON CORP·Filed 1996·Granted Feb 8, 2000·65 cites·10 claims
- 0589US7829935B2Semiconductor memory, semiconductor memory system using the memory, and method for manufacturing quantum dot used in semiconductor memoryUNIV HIROSHIMA·Filed 2008·Granted Nov 9, 2010·19 cites·14 claims
- 0686US7782311B2Liquid crystal display device, driving method for liquid crystal display devices, and inspection method for liquid crystal display devicesSEIKO EPSON CORP·Filed 2007·Granted Aug 24, 2010·4 cites·10 claims
- 0784US9275588B2Liquid crystal display device, driving method for liquid crystal display devices, and inspection method for liquid crystal display devicesSEIKO EPSON CORP·Filed 2013·Granted Mar 1, 2016·2 cites·3 claims
- 0884US7768032B2Light-emitting device with enhanced luminous efficiency and method of producing the sameUNIV HIROSHIMA·Filed 2008·Granted Aug 3, 2010·11 cites·11 claims
- 0979US6337677B1Liquid crystal display device, driving method for liquid crystal display devices, and inspection method for liquid crystal display devicesSEIKO EPSON CORP·Filed 1998·Granted Jan 8, 2002·33 cites·7 claims
- 1072US6905920B2Method for fabrication of field-effect transistor to reduce defects at MOS interfaces formed at low temperatureSEIKO EPSON CORP·Filed 2001·Granted Jun 14, 2005·17 cites·16 claims
- 1169US5834827AThin film semiconductor device, fabrication method thereof, electronic device and its fabrication methodSEIKO EPSON CORP·Filed 1996·Granted Nov 10, 1998·29 cites·6 claims
- 1265US7898020B2Semiconductor memory, semiconductor memory system using the same, and method for producing quantum dots applied to semiconductor memoryUNIV HIROSHIMA·Filed 2007·Granted Mar 1, 2011·3 cites·11 claims
- 1360US7271793B2Liquid crystal display device, driving method for liquid crystal display devices, and inspection method for liquid crystal display devicesSEIKO EPSON CORP·Filed 2001·Granted Sep 18, 2007·3 cites·8 claims
- 1459US8419272B2Temperature measuring device, thermal treatment device using the same, temperature measuring methodHIGASHI SEIICHIRO·Filed 2006·Granted Apr 16, 2013·1 cites·19 claims
- 1558US8704747B2Liquid crystal display device, driving method for liquid crystal display devices, and inspection method for liquid crystal display devicesHIGASHI SEIICHIRO·Filed 2011·Granted Apr 22, 2014·0 cites·13 claims
- 1654US8653518B2Semiconductor deviceMAKIHARA KATSUNORI·Filed 2007·Granted Feb 18, 2014·2 cites·20 claims
- 1751US8900953B2Crystal manufacturing apparatus, semiconductor device manufactured using the same, and method of manufacturing semiconductor device using the sameHIGASHI SEIICHIRO·Filed 2009·Granted Dec 2, 2014·1 cites·2 claims
- 1846US7812621B2Measuring apparatus and method for measuring a surface capacitance of an insulating filmUNIV HIROSHIMA·Filed 2008·Granted Oct 12, 2010·0 cites·10 claims
- 1937US9343576B2Thin film forming method, semiconductor substrate and electronic device produced by employing sameUNIV HIROSHIMA·Filed 2015·Granted May 17, 2016·0 cites·22 claims
- 2036US2002090772A1Method for manufacturing semiconductor lamination, method for manufacturing lamination, semiconductor device, and electronic equipmentSEIKO EPSON CORP·Filed 2001·Application pending·0 cites
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