Inventor · disambiguated record
Edwin Flecha
Also filed as: FLECHA EDWIN
11 granted patents·336 citations·filing 1994–2000
93Inventor score
Files withIBM11
Top patents by PatentIndex Score
11 records- 0184US6169281B1Apparatus and method for determining side wall profiles using a scanning probe microscope having a probe dithered in lateral directionsIBM·Filed 1998·Granted Jan 2, 2001·85 cites·28 claims
- 0281US6220084B1Detecting fields with a single-pass, dual-amplitude-mode scanning force microscopeIBM·Filed 2000·Granted Apr 24, 2001·26 cites·6 claims
- 0371US6079254AScanning force microscope with automatic surface engagement and improved amplitude demodulationIBM·Filed 1998·Granted Jun 27, 2000·46 cites·16 claims
- 0471US5902928AControlling engagement of a scanning microscope probe with a segmented piezoelectric actuatorIBM·Filed 1997·Granted May 11, 1999·41 cites·17 claims
- 0570US6318159B1Scanning force microscope with automatic surface engagementIBM·Filed 2000·Granted Nov 20, 2001·22 cites·14 claims
- 0669US5918274ADetecting fields with a single-pass, dual-amplitude-mode scanning force microscopeIBM·Filed 1997·Granted Jun 29, 1999·30 cites·7 claims
- 0763US5801381AMethod for protecting a probe tip using active lateral scanning controlIBM·Filed 1997·Granted Sep 1, 1998·29 cites·17 claims
- 0854US5773824AMethod for improving measurement accuracy using active lateral scanning control of a probeIBM·Filed 1997·Granted Jun 30, 1998·20 cites·19 claims
- 0953US5432460AApparatus and method for opens and shorts testing of a circuit boardIBM·Filed 1994·Granted Jul 11, 1995·18 cites·8 claims
- 1052US6167753B1Detecting fields with a single-pass, dual-amplitude-mode scanning force microscopeIBM·Filed 1999·Granted Jan 2, 2001·13 cites·14 claims
- 1148US6234009B1Controlling motion of a scanning force microscope probe tip moving into engagement with a sample surfaceIBM·Filed 2000·Granted May 22, 2001·6 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →