Inventor · disambiguated record
Shuichi Muraishi
Also filed as: MURAISHI SHUICHI
2 granted patents·49 citations·filing 1990–2000
64Inventor score
Technology areasG01N
Top patents by PatentIndex Score
2 records- 0179US6545755B1Micro-Raman spectroscopy system for identifying foreign material on a semiconductor waferJEOL LTD·Filed 2000·Granted Apr 8, 2003·34 cites·16 claims
- 0245US5066599ASilicon crystal oxygen evaluation method using fourier transform infrared spectroscopy (ftir) and semiconductor device fabrication method using the sameFUJITSU LTD·Filed 1990·Granted Nov 19, 1991·15 cites·25 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →