Inventor · disambiguated record
James M. Crafts
Also filed as: CRAFTS JAMES M · CRAFTS JAMES MANSFIELD
7 granted patents·2 pending applications·145 citations·filing 1999–2024
81Inventor score
Top patents by PatentIndex Score
9 records- 0193US6275051B1Segmented architecture for wafer test and burn-inIBM·Filed 1999·Granted Aug 14, 2001·127 cites·27 claims
- 0284US8734006B2Calibration of an on-die thermal sensorCRAFTS JAMES M·Filed 2011·Granted May 27, 2014·14 cites·18 claims
- 0368US9285417B2Low-voltage IC test for defect screeningGLOBALFOUNDRIES INC·Filed 2013·Granted Mar 15, 2016·3 cites·20 claims
- 0458US2025364367A1Dual level cold plate for multiple semiconductor die moduleIBM·Filed 2024·Application pending·0 cites
- 0553US11422611B2Adaptive frequency optimization in processorsIBM·Filed 2019·Granted Aug 23, 2022·0 cites·20 claims
- 0651US10509457B2Adaptive frequency optimization in processorsIBM·Filed 2017·Granted Dec 17, 2019·0 cites·17 claims
- 0747US9152517B2Programmable active thermal controlCHASE HAROLD·Filed 2011·Granted Oct 6, 2015·1 cites·16 claims
- 0839US12141759B2Determining utility infrastructure and connectivity interruptionsIBM·Filed 2021·Granted Nov 12, 2024·0 cites·17 claims
- 0933US2001050567A1Segmented architecture for wafer test & burn-inIBM·Filed 2001·Application pending·0 cites
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