Inventor · disambiguated record
Yuichi Sakurai
Also filed as: SAKURAI YUICHI
16 granted patents·6 pending applications·95 citations·filing 1997–2025
91Inventor score
Top patents by PatentIndex Score
22 records- 0189US12339652B2Facility diagnosis device and facility diagnosis methodHITACHI LTD·Filed 2022·Granted Jun 24, 2025·1 cites·7 claims
- 0286US11392871B2Work support device, work support method, and work support programHITACHI LTD·Filed 2020·Granted Jul 19, 2022·2 cites·15 claims
- 0377US10522325B2Charged particle beam device and image processing method in charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2015·Granted Dec 31, 2019·2 cites·17 claims
- 0474US6113680APigmented ink and process for production thereofHITACHI MAXELL·Filed 1998·Granted Sep 5, 2000·31 cites·11 claims
- 0571US6477136B2Optical recording mediumHITACHI MAXELL·Filed 2001·Granted Nov 5, 2002·9 cites·4 claims
- 0663US10845794B2State identification device, state identification method and mechanical deviceHITACHI LTD·Filed 2019·Granted Nov 24, 2020·0 cites·10 claims
- 0763US10763078B2Charged particle beam device and image processing method in charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2019·Granted Sep 1, 2020·0 cites·17 claims
- 0861US5944883AUltrafine particle organic pigment color ink and method for producing the sameHITACHI MAXELL·Filed 1997·Granted Aug 31, 1999·20 cites·14 claims
- 0959US2025348364A1Computer system and parameter changing methodHITACHI LTD·Filed 2025·Application pending·0 cites
- 1058US9489324B2Data processing device, semiconductor external view inspection device, and data volume increase alleviation methodHITACHI HIGH TECH CORP·Filed 2012·Granted Nov 8, 2016·1 cites·12 claims
- 1158US6013124APigment ink for ink-jet recordingHITACHI MAXELL·Filed 1997·Granted Jan 11, 2000·19 cites·16 claims
- 1257US8385627B2Method and apparatus for inspecting defects of semiconductor deviceHITACHI HIGH TECH CORP·Filed 2006·Granted Feb 26, 2013·2 cites·7 claims
- 1353US9935456B2Wireless power transmission deviceTOKIN CORP·Filed 2014·Granted Apr 3, 2018·1 cites·8 claims
- 1449US10908595B2Facility state determination device, facility state determination method, and facility management systemHITACHI LTD·Filed 2019·Granted Feb 2, 2021·0 cites·11 claims
- 1547US8032332B2Semiconductor inspecting apparatusHITACHI HIGH TECH CORP·Filed 2008·Granted Oct 4, 2011·0 cites·12 claims
- 1642US2007069865A1IC tag, IC tag system, and data communicating method for the IC tagNEC TOKIN CORP·Filed 2006·Application pending·0 cites
- 1740US2015280429A1Communication apparatus and electronic deviceNEC TOKIN CORP·Filed 2014·Application pending·0 cites
- 1839US5964930ABlack pigment ink and method for producing the sameHITACHI MAXELL·Filed 1997·Granted Oct 12, 1999·7 cites·14 claims
- 1937US2012132025A1Ball ScrewSAKURAI YUICHI·Filed 2010·Application pending·0 cites
- 2036US7311519B2Raw material feeding apparatus for rotary hearth furnaceNIPPON STEEL CORP·Filed 2003·Granted Dec 25, 2007·0 cites·6 claims
- 2134US2002015915A1Azo compound containing metal and optical recording medium using the compoundFiled 2001·Application pending·0 cites
- 2228US2013136334A1Semiconductor Inspecting ApparatusSAKURAI YUICHI·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →