Inventor · disambiguated record
Verle W. Aebi
Also filed as: AEBI VERLE · AEBI VERLE W
15 granted patents·384 citations·filing 1990–2023
93Inventor score
Top patents by PatentIndex Score
15 records- 0193US8975668B2Backside-thinned image sensor using Al2 O3 surface passivationCOSTELLO KENNETH A·Filed 2012·Granted Mar 10, 2015·37 cites·16 claims
- 0286US6285018B1Electron bombarded active pixel sensorINTEVAC INC·Filed 1999·Granted Sep 4, 2001·117 cites·25 claims
- 0386US5374826AHybrid photomultiplier tube with high sensitivityINTEVAC INC·Filed 1993·Granted Dec 20, 1994·46 cites·26 claims
- 0484US6657178B2Electron bombarded passive pixel sensor imagingINTEVAC INC·Filed 2001·Granted Dec 2, 2003·26 cites·30 claims
- 0582US5047821ATransferred electron III-V semiconductor photocathodeINTEVAC INC·Filed 1990·Granted Sep 10, 1991·42 cites·19 claims
- 0676US12002834B2Compact proximity focused image sensorEOTECH LLC·Filed 2023·Granted Jun 4, 2024·0 cites·20 claims
- 0776US5268612AFeedback limited microchannel plateINTEVAC INC·Filed 1991·Granted Dec 7, 1993·24 cites·38 claims
- 0875US5326978AFocused electron-bombarded detectorINTEVAC INC·Filed 1992·Granted Jul 5, 1994·28 cites·18 claims
- 0973US5512375APseudomorphic substratesINTEVAC INC·Filed 1993·Granted Apr 30, 1996·25 cites·12 claims
- 1070US5391101AMethod of manufacturing a feedback limited microchannel plateINTEVAC INC·Filed 1993·Granted Feb 21, 1995·18 cites·10 claims
- 1166US5912500AIntegrated photocathodeINTEVAC INC·Filed 1995·Granted Jun 15, 1999·19 cites·10 claims
- 1264US11621289B2Compact proximity focused image sensorEOTECH LLC·Filed 2020·Granted Apr 4, 2023·0 cites·18 claims
- 1359US7531826B2Photocathode structure and operationINTEVAC INC·Filed 2005·Granted May 12, 2009·2 cites·24 claims
- 1451US8421012B2Low energy portable low-light camera with wavelength cutoffAEBI VERLE W·Filed 2010·Granted Apr 16, 2013·0 cites·20 claims
- 1546US10692683B2Thermally assisted negative electron affinity photocathodeINTEVAC INC·Filed 2017·Granted Jun 23, 2020·0 cites·19 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →