Inventor · disambiguated record
Kendall W. Gordon, Jr.
Also filed as: GORDON JR KENDALL W · GORDON KENDALL W
12 granted patents·162 citations·filing 1992–2012
91Inventor score
Top patents by PatentIndex Score
12 records- 0194US5875419ASystem and method for determining yarn hairinessLAWSON HEMPHILL·Filed 1995·Granted Feb 23, 1999·26 cites·10 claims
- 0275US6741726B1System and method for electronically evaluating predicted fabric qualitiesLAWSON HEMPHILL·Filed 2000·Granted May 25, 2004·22 cites·31 claims
- 0373US8131483B2Yarn entanglement strength testerROSS DEAN A·Filed 2010·Granted Mar 6, 2012·4 cites·24 claims
- 0472US5319578AYarn profile analyzer and methodLAWSON HEMPHILL·Filed 1992·Granted Jun 7, 1994·38 cites·30 claims
- 0557US6130746ASystem and method for electronically evaluating predicted fabric qualitiesLAWSON HEMPHILL·Filed 1996·Granted Oct 10, 2000·18 cites·2 claims
- 0655US5791542AYarn test system which moves yarn at high speed under constant, adjustable tensionLAWSON HEMPHILL·Filed 1997·Granted Aug 11, 1998·12 cites·16 claims
- 0751US5646405AMethod of detecting contaminants in cotton fibersLAWSON HEMPHILL·Filed 1995·Granted Jul 8, 1997·15 cites·20 claims
- 0845US9581531B2Yarn entanglement strength testerROSS DEAN A·Filed 2012·Granted Feb 28, 2017·0 cites·20 claims
- 0944US5541734ASystem for electronically grading yarnLAWSON HEMPHILL·Filed 1994·Granted Jul 30, 1996·10 cites·16 claims
- 1042US5570188ASystem and method for electronically displaying yarn qualitiesLAWSON HEMPHILL·Filed 1994·Granted Oct 29, 1996·9 cites·16 claims
- 1137US5420802ASystem and method for testing yarn altering devicesLAWSON HEMPHILL·Filed 1993·Granted May 30, 1995·7 cites·18 claims
- 1230US5761264AMethod of automatically determining the number of filaments in a synthetic or spun yarnLAWSON HEMPHILL·Filed 1996·Granted Jun 2, 1998·1 cites·12 claims
Join the waitlist — get patent alerts
Get an alert when Kendall W. Gordon, Jr. files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →