Inventor · disambiguated record
Kotaro Takijiri
Also filed as: TAKIJIRI KOTARO
17 granted patents·6 pending applications·44 citations·filing 2007–2024
89Inventor score
Top patents by PatentIndex Score
23 records- 0187US10138555B2Gas control system and program for gas control systemHORIBA STEC CO LTD·Filed 2016·Granted Nov 27, 2018·3 cites·7 claims
- 0284US10921828B2Fluid control apparatus and flow rate ratio control apparatusHORIBA LTD·Filed 2019·Granted Feb 16, 2021·4 cites·6 claims
- 0382US9823667B2Flow rate control apparatus, storage medium storing program for flow rate control apparatus and flow rate control methodHORIBA STEC CO LTD·Filed 2015·Granted Nov 21, 2017·5 cites·7 claims
- 0482US9075414B2Pressure control device, flow rate control device and recording medium having programs used for pressure control device, recording medium having programs used for flow rate control deviceHORIBA STEC CO LTD·Filed 2013·Granted Jul 7, 2015·11 cites·7 claims
- 0579US8459290B2Material gas concentration control systemMINAMI MASAKAZU·Filed 2009·Granted Jun 11, 2013·15 cites·12 claims
- 0673US11789435B2Flow control device, diagnostic method, and program for flow control deviceHORIBA STEC CO LTD·Filed 2019·Granted Oct 17, 2023·1 cites·9 claims
- 0770US10082806B2Flow-rate control device and flow-rate control programHORIBA STEC CO LTD·Filed 2014·Granted Sep 25, 2018·4 cites·9 claims
- 0865US2025147526A1Control parameter calculation apparatus, control parameter calculation method, and control parameter calculation programHORIBA STEC CO LTD·Filed 2024·Application pending·0 cites
- 0964US2024286060A1Concentration control device, raw material vaporization system, concentration control method, and recording medium storing concentration control programHORIBA STEC CO LTD·Filed 2024·Application pending·0 cites
- 1062US2025006524A1Wafer temperature control device, wafer temperature control method and wafer temperature control programHORIBA STEC CO LTD·Filed 2024·Application pending·0 cites
- 1161US12463069B2Wafer temperature control device, wafer temperature control method, and wafer temperature control programHORIBA STEC CO LTD·Filed 2023·Granted Nov 4, 2025·0 cites·8 claims
- 1260US2024258139A1Wafer temperature control device, wafer temperature control method and wafer temperature control programHORIBA STEC CO LTD·Filed 2024·Application pending·0 cites
- 1357US12474722B2Flow rate control apparatus, flow rate control method, and program recording medium in which program for flow rate control apparatus is recordedHORIBA STEC CO LTD·Filed 2021·Granted Nov 18, 2025·0 cites·19 claims
- 1455US9459629B2Flow rate controller and recording medium recorded with program for flow rate controllerHORIBA STEC CO LTD·Filed 2013·Granted Oct 4, 2016·1 cites·7 claims
- 1554US2025372417A1Wafer temperature control device, control method for wafer temperature control device, and program for wafer temperature control deviceHORIBA STEC CO LTD·Filed 2022·Application pending·0 cites
- 1651US11644852B2Flow rate ratio control system, film forming system, abnormality diagnosis method, and abnormality diagnosis program mediumHORIBA STEC CO LTD·Filed 2021·Granted May 9, 2023·0 cites·10 claims
- 1748US8054081B2Residual gas analyzerHORIBA STEC CO LTD·Filed 2007·Granted Nov 8, 2011·0 cites·7 claims
- 1848US2025370485A1Valve control device, valve control method, valve control program, and fluid control deviceHORIBA STEC CO LTD·Filed 2022·Application pending·0 cites
- 1947US11906984B2Concentration control system, concentration control method and program for a concentration control systemHORIBA STEC CO LTD·Filed 2021·Granted Feb 20, 2024·0 cites·8 claims
- 2046US10705545B2Fluid control device and flow rate ratio control deviceHORIBA STEC CO LTD·Filed 2019·Granted Jul 7, 2020·0 cites·20 claims
- 2145US10302476B2Flow rate control deviceHORIBA STEC CO LTD·Filed 2017·Granted May 28, 2019·0 cites·5 claims
- 2242US10234884B2Power supply apparatus of fluid control and measurement systemHORIBA STEC CO LTD·Filed 2015·Granted Mar 19, 2019·0 cites·7 claims
- 2340US10216162B2Fluid control and measurement system with a relayHORIBA STEC CO LTD·Filed 2015·Granted Feb 26, 2019·0 cites·3 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →