Inventor · disambiguated record
Timothy G. Dunham
Also filed as: DUNHAM TIMOTHY · DUNHAM TIMOTHY G
20 granted patents·1 pending application·173 citations·filing 1999–2024
94Inventor score
Top patents by PatentIndex Score
21 records- 0192US7353472B2System and method for testing pattern sensitive algorithms for semiconductor designIBM·Filed 2005·Granted Apr 1, 2008·14 cites·10 claims
- 0288US7902866B1Wires on demand: run-time communication synthesis for reconfigurable computingVIRGINIA TECH INTELL PROP·Filed 2008·Granted Mar 8, 2011·44 cites·19 claims
- 0388US7312141B2Shapes-based migration of aluminum designs to copper damasceneIBM·Filed 2005·Granted Dec 25, 2007·14 cites·17 claims
- 0483US6528883B1Shapes-based migration of aluminum designs to copper damasceneIBM·Filed 2000·Granted Mar 4, 2003·31 cites·3 claims
- 0574US6559543B1Stacked fill structures for support of dielectric layersIBM·Filed 2001·Granted May 6, 2003·18 cites·10 claims
- 0672US7051307B2Autonomic graphical partitioningIBM·Filed 2003·Granted May 23, 2006·17 cites·29 claims
- 0769US7669175B2Methodology to improve turnaround for integrated circuit design using geometrical hierarchyIBM·Filed 2007·Granted Feb 23, 2010·4 cites·8 claims
- 0868US2025097059A1Computer technology to ensure an electronic design automation (eda) implementation for electronic circuitry is traceable, auditable, and reproducibleGRAF RES CORPORATION·Filed 2024·Application pending·0 cites
- 0967US6992002B2Shapes-based migration of aluminum designs to copper damascenceIBM·Filed 2002·Granted Jan 31, 2006·12 cites·3 claims
- 1065US7498250B2Shapes-based migration of aluminum designs to copper damasceneIBM·Filed 2007·Granted Mar 3, 2009·2 cites·13 claims
- 1164US8201132B2System and method for testing pattern sensitive algorithms for semiconductor designDEMARIS DAVID L·Filed 2009·Granted Jun 12, 2012·1 cites·8 claims
- 1260US7709967B2Shapes-based migration of aluminum designs to copper damasceneIBM·Filed 2007·Granted May 4, 2010·1 cites·20 claims
- 1359US12166909B2Computer technology to ensure an electronic design automation (EDA) implementation for electronic circuitry is traceable, auditable, and reproducibleGRAF RES CORPORATION·Filed 2022·Granted Dec 10, 2024·0 cites·20 claims
- 1456US7685544B2Testing pattern sensitive algorithms for semiconductor designIBM·Filed 2007·Granted Mar 23, 2010·0 cites·10 claims
- 1553US6743710B2Stacked fill structures for support of dielectric layersIBM·Filed 2003·Granted Jun 1, 2004·4 cites·20 claims
- 1650US7542599B2Reducing number of relatively unimportant shapes from a set of shapesIBM·Filed 2007·Granted Jun 2, 2009·0 cites·9 claims
- 1749US7876952B2Removal of relatively unimportant shapes from a set of shapesIBM·Filed 2008·Granted Jan 25, 2011·0 cites·10 claims
- 1849US7707535B2Stitched IC chip layout design structureIBM·Filed 2007·Granted Apr 27, 2010·0 cites·7 claims
- 1946US7289658B2Removal of relatively unimportant shapes from a set of shapesIBM·Filed 2003·Granted Oct 30, 2007·2 cites·1 claims
- 2043US7703060B2Stitched IC layout methods, systems and program productIBM·Filed 2007·Granted Apr 20, 2010·0 cites·16 claims
- 2139US6444581B1AB etch endpoint by ABFILL compensationIBM·Filed 1999·Granted Sep 3, 2002·9 cites·10 claims
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