Individual holder
DEMARIS DAVID L
US·3 granted patents·2 pending applications·3 citations·filing 2007–2012
Individually held — no corporate assignee on record.
Top patents by PatentIndex Score
5 records- 0164US8201132B2System and method for testing pattern sensitive algorithms for semiconductor designDEMARIS DAVID L·Filed 2009·Granted Jun 12, 2012·1 cites·8 claims
- 0263US8667427B2Method of optimization of a manufacturing process of an integrated circuit layoutDEMARIS DAVID L·Filed 2012·Granted Mar 4, 2014·1 cites·15 claims
- 0363US8661370B2Optimization of a manufacturing process of an integrated circuit layoutDEMARIS DAVID L·Filed 2012·Granted Feb 25, 2014·1 cites·16 claims
- 0450US2008247633A1System for generating a set of test patterns for an optical proximity correction algorithmDEMARIS DAVID L·Filed 2008·Application pending·0 cites
- 0543US2008320421A1Feature extraction that supports progressively refined search and classification of patterns in a semiconductor layoutDEMARIS DAVID L·Filed 2007·Application pending·0 cites
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