Inventor · disambiguated record
Chih-Shiang Chou
Also filed as: CHOU CHIH-SHIANG
11 granted patents·2 pending applications·44 citations·filing 2011–2023
87Inventor score
Files withTAIWAN SEMICONDUCTOR MFG CO LTD8CHANG CHING-HSU1CHOU CHIH-SHIANG1CHU FU-SHENG1KUO CHENG-CHENG1
Top patents by PatentIndex Score
13 records- 0192US10495967B2Method of mask simulation model for OPC and mask makingTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted Dec 3, 2019·7 cites·20 claims
- 0292US8572520B2Optical proximity correction for mask repairCHOU CHIH-SHIANG·Filed 2012·Granted Oct 29, 2013·28 cites·18 claims
- 0380US10866397B2Microscope apparatusTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Dec 15, 2020·2 cites·20 claims
- 0479US9091930B2Enhanced EUV lithography systemCHANG CHING-HSU·Filed 2012·Granted Jul 28, 2015·2 cites·20 claims
- 0576US10962875B2Method of mask simulation model for OPC and mask makingTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Mar 30, 2021·1 cites·20 claims
- 0674US9395618B2Enhanced EUV lithography systemTAIWAN SEMICONDUCTOR MFG·Filed 2015·Granted Jul 19, 2016·1 cites·20 claims
- 0768US11619806B2Microscope apparatusTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Apr 4, 2023·0 cites·20 claims
- 0865US8928973B2Microscope apparatus for phase image acquisitionCHU FU-SHENG·Filed 2011·Granted Jan 6, 2015·2 cites·20 claims
- 0961US8656319B2Optical proximity correction convergence controlKUO CHENG-CHENG·Filed 2012·Granted Feb 18, 2014·1 cites·20 claims
- 1059US9880460B2Enhanced EUV lithography systemTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Jan 30, 2018·0 cites·20 claims
- 1157US10295813B2Microscope apparatus and method for phase image acquisitionTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2014·Granted May 21, 2019·0 cites·20 claims
- 1257US2025004383A1Method of producing mask data for semiconductor device manufacturingTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Application pending·0 cites
- 1338US2014123084A1System and Method for Improving a Lithography Simulation ModelTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2012·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →