Inventor · disambiguated record
Akihiro Otaka
Also filed as: OTAKA AKIHIRO
12 granted patents·17 citations·filing 1999–2023
85Inventor score
Top patents by PatentIndex Score
12 records- 0188US11694324B2Inspection apparatus and inspection methodHAMAMATSU PHOTONICS KK·Filed 2020·Granted Jul 4, 2023·2 cites·19 claims
- 0277US9618550B2Apparatus for frequency analyzing a measurement target and method of frequency analyzing a measurement targetHAMAMATSU PHOTONICS KK·Filed 2014·Granted Apr 11, 2017·3 cites·18 claims
- 0377US9618576B2Apparatus for testing a semiconductor device and method of testing a semiconductor deviceHAMAMATSU PHOTONICS KK·Filed 2014·Granted Apr 11, 2017·3 cites·18 claims
- 0470US9596046B2Optical line terminal and optical network unitNIPPON TELEGRAPH & TELEPHONE·Filed 2013·Granted Mar 14, 2017·2 cites·12 claims
- 0568US10698006B2Inspection method and inspection apparatusHAMAMATSU PHOTONICS KK·Filed 2016·Granted Jun 30, 2020·1 cites·14 claims
- 0666US11009531B2Image generating method, image generating device, image generating program, and storage mediumHAMAMATSU PHOTONICS KK·Filed 2020·Granted May 18, 2021·0 cites·13 claims
- 0764US12387309B2Inspection apparatus and inspection methodHAMAMATSU PHOTONICS KK·Filed 2023·Granted Aug 12, 2025·0 cites·18 claims
- 0858US10656187B2Image generating method, image generating device, image generating program, and storage mediumHAMAMATSU PHOTONICS KK·Filed 2016·Granted May 19, 2020·0 cites·14 claims
- 0952US9680595B2Optical line terminal and optical network unitNIPPON TELEGRAPH & TELEPHONE·Filed 2013·Granted Jun 13, 2017·0 cites·36 claims
- 1041US11047792B2Semiconductor device inspection method and semiconductor device inspection apparatusHAMAMATSU PHOTONICS KK·Filed 2017·Granted Jun 29, 2021·0 cites·17 claims
- 1138US8929737B2Optical line terminal and optical network unitKUBO RYOGO·Filed 2010·Granted Jan 6, 2015·0 cites·9 claims
- 1230US6470017B1Packet multiplexing apparatusNIPPON TELEGRAPH & TELEPHONE·Filed 1999·Granted Oct 22, 2002·6 cites·23 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →