Inventor · disambiguated record
Sagar Magia
Also filed as: MAGIA SAGAR
19 granted patents·1 pending application·230 citations·filing 2013–2016
94Inventor score
Top patents by PatentIndex Score
20 records- 0197US9934872B2Erase stress and delta erase loop count methods for various fail modes in non-volatile memorySANDISK TECHNOLOGIES LLC·Filed 2014·Granted Apr 3, 2018·44 cites·26 claims
- 0296US9449698B1Block and zone erase algorithm for memorySANDISK TECHNOLOGIES INC·Filed 2015·Granted Sep 20, 2016·48 cites·20 claims
- 0394US10032524B2Techniques for determining local interconnect defectsSANDISK TECHNOLOGIES LLC·Filed 2015·Granted Jul 24, 2018·8 cites·25 claims
- 0494US9202593B1Techniques for detecting broken word lines in non-volatile memoriesSANDISK TECHNOLOGIES INC·Filed 2014·Granted Dec 1, 2015·21 cites·24 claims
- 0594US8710914B1Voltage regulators with improved wake-up responseSANDISK TECHNOLOGIES INC·Filed 2013·Granted Apr 29, 2014·20 cites·26 claims
- 0693US9224502B1Techniques for detection and treating memory hole to local interconnect marginality defectsSANDISK TECHNOLOGIES INC·Filed 2015·Granted Dec 29, 2015·15 cites·31 claims
- 0792US9449694B2Non-volatile memory with multi-word line select for defect detection operationsSANDISK TECHNOLOGIES INC·Filed 2014·Granted Sep 20, 2016·21 cites·15 claims
- 0890US9269446B1Methods to improve programming of slow cellsSANDISK TECHNOLOGIES INC·Filed 2015·Granted Feb 23, 2016·13 cites·21 claims
- 0989US9548129B2Word line look ahead read for word line to word line short detectionSANDISK TECHNOLOGIES INC·Filed 2015·Granted Jan 17, 2017·12 cites·13 claims
- 1087US9530514B1Select gate defect detectionSANDISK TECHNOLOGIES INC·Filed 2016·Granted Dec 27, 2016·8 cites·20 claims
- 1180US9564219B2Current based detection and recording of memory hole-interconnect spacing defectsSANDISK TECHNOLOGIES INC·Filed 2015·Granted Feb 7, 2017·6 cites·8 claims
- 1279US9240249B1AC stress methods to screen out bit line defectsSANDISK TECHNOLOGIES INC·Filed 2014·Granted Jan 19, 2016·6 cites·21 claims
- 1376US9653175B2Determination of word line to word line shorts between adjacent blocksSANDISK TECHNOLOGIES LLC·Filed 2016·Granted May 16, 2017·2 cites·16 claims
- 1463US9830998B2Stress patterns to detect shorts in three dimensional non-volatile memorySANDISK TECHNOLOGIES INC·Filed 2015·Granted Nov 28, 2017·2 cites·13 claims
- 1556US9514835B2Determination of word line to word line shorts between adjacent blocksSANDISK TECHNOLOGIES LLC·Filed 2014·Granted Dec 6, 2016·1 cites·20 claims
- 1654US9484086B2Determination of word line to local source line shortsSANDISK TECHNOLOGIES LLC·Filed 2014·Granted Nov 1, 2016·1 cites·19 claims
- 1753US9496040B2Adaptive multi-page programming methods and apparatus for non-volatile memorySANDISK TECHNOLOGIES INC·Filed 2015·Granted Nov 15, 2016·1 cites·22 claims
- 1848US2016124664A1Block Level Local Column Redundancy Methods for Higher YieldSANDISK TECHNOLOGIES INC·Filed 2014·Application pending·0 cites
- 1945US9443612B2Determination of bit line to low voltage signal shortsSANDISK TECHNOLOGIES INC·Filed 2014·Granted Sep 13, 2016·1 cites·23 claims
- 2041US9460809B2AC stress mode to screen out word line to word line shortsSANDISK TECHNOLOGIES LLC·Filed 2014·Granted Oct 4, 2016·0 cites·40 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →