Inventor · disambiguated record
Tadanori Nishikobara
Also filed as: NISHIKOBARA TADANORI
5 granted patents·1 pending application·19 citations·filing 2003–2011
71Inventor score
Top patents by PatentIndex Score
6 records- 0163US7010444B2Measuring apparatus and measuring method for pattern dependent jitterANRITSU CORP·Filed 2003·Granted Mar 7, 2006·13 cites·19 claims
- 0259US8143959B2Jitter generation apparatus, device test system using the same, and jitter generation methodYAGINUMA KATSUYUKI·Filed 2010·Granted Mar 27, 2012·4 cites·21 claims
- 0351US7574311B2Time interval measuring apparatus and jitter measuring apparatus using the sameANRITSU CORP·Filed 2006·Granted Aug 11, 2009·2 cites·40 claims
- 0434US2011119622A1Window display control apparatus and method of controlling window displaysANRITSU CORP·Filed 2010·Application pending·0 cites
- 0527US8442662B2Measurement parameter input control device and measurement parameter input control methodNIKI YOHEI·Filed 2011·Granted May 14, 2013·0 cites·3 claims
- 0625US8391346B2Data signal quality evaluation apparatusMASUHARA KEITA·Filed 2011·Granted Mar 5, 2013·0 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →