Inventor · disambiguated record
Ken Mochizuki
Also filed as: MOCHIZUKI KEN
10 granted patents·30 citations·filing 1985–2016
84Inventor score
Top patents by PatentIndex Score
10 records- 0161US7450633B2Wander generator, and digital line tester and phase noise transfer characteristic analyzer using the sameANRITSU CORP·Filed 2007·Granted Nov 11, 2008·2 cites·8 claims
- 0260US6972603B2Maximum time interval error test signal generating apparatus not affected by low-pass measuring filterANRITSU CORP·Filed 2003·Granted Dec 6, 2005·5 cites·20 claims
- 0351US7574311B2Time interval measuring apparatus and jitter measuring apparatus using the sameANRITSU CORP·Filed 2006·Granted Aug 11, 2009·2 cites·40 claims
- 0451US7248981B2Jitter measurement device and jitter measurement methodANRITSU CORP·Filed 2004·Granted Jul 24, 2007·6 cites·26 claims
- 0550US7206339B2Wonder generator, digital line tester comprising the same, and phase noise transfer characteristic analyzerANRITSU CORP·Filed 2000·Granted Apr 17, 2007·1 cites·7 claims
- 0645US10234483B2Sampling circuit, sampling method, sampling oscilloscope, and waveform display methodANRITSU CORP·Filed 2016·Granted Mar 19, 2019·0 cites·14 claims
- 0744US8855182B2Optimization method of optimally setting emphasis and optimization device for optimally setting emphasisMURAKAMI TAKASHI·Filed 2013·Granted Oct 7, 2014·0 cites·6 claims
- 0844US4642127AMethod for cooling blast furnace gas in an heat recovery systemSUMITOMO METAL IND·Filed 1985·Granted Feb 10, 1987·14 cites·2 claims
- 0929US8432958B2Apparatus for measuring jitter transfer characteristicSUZUKI SEIYA·Filed 2010·Granted Apr 30, 2013·0 cites·7 claims
- 1027US8208586B2Jitter measuring apparatusTSUCHIYA NAOSUKE·Filed 2010·Granted Jun 26, 2012·0 cites·6 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →