Inventor · disambiguated record
Naoto Iizuka
Also filed as: IIZUKA NAOTO
3 granted patents·1 pending application·15 citations·filing 1997–2008
66Inventor score
Technology areasH10P
Top patents by PatentIndex Score
4 records- 0161US8569148B2Final polishing method for silicon single crystal wafer and silicon single crystal waferIIZUKA NAOTO·Filed 2008·Granted Oct 29, 2013·4 cites·9 claims
- 0235US2004072437A1Production method for silicon wafer and silicon wafer and soi waferFiled 2002·Application pending·0 cites
- 0333US6058947AContamination monitoring systemSEH AMERICA INC·Filed 1998·Granted May 9, 2000·7 cites·15 claims
- 0427US5849103AMethod of monitoring fluid contaminationSEH AMERICA INC·Filed 1997·Granted Dec 15, 1998·4 cites·5 claims
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