Inventor · disambiguated record
Hideyuki Sunaga
Also filed as: SUNAGA HIDEYUKI
6 granted patents·11 citations·filing 2018–2020
73Inventor score
Top patents by PatentIndex Score
6 records- 0193US11614415B2Nondestructive testing system and nondestructive testing methodTOPCON CORP·Filed 2020·Granted Mar 28, 2023·5 cites·20 claims
- 0288US11754516B2Nondestructive test system comprising a neutron emission unit for emitting fast neutrons and a neutron detection unit for detecting thermal neutrons, and nondestructive test methodTOPCON CORP·Filed 2020·Granted Sep 12, 2023·2 cites·20 claims
- 0388US11513084B2Nondestructive inspecting system, and nondestructive inspecting methodTOPCON CORP·Filed 2019·Granted Nov 29, 2022·4 cites·10 claims
- 0456US11747288B2Non-destructive inspection system comprising neutron radiation source and neutron radiation methodTOPCON CORP·Filed 2019·Granted Sep 5, 2023·0 cites·10 claims
- 0552US11609190B2Non-destructive inspection methodTOPCON CORP·Filed 2018·Granted Mar 21, 2023·0 cites·16 claims
- 0648US11985755B2Target structure and target deviceRIKEN·Filed 2019·Granted May 14, 2024·0 cites·13 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →