Inventor · disambiguated record
Kenichi Kadota
Also filed as: KADOTA KENICHI
15 granted patents·2 pending applications·243 citations·filing 2003–2021
93Inventor score
Top patents by PatentIndex Score
17 records- 0195US7973281B2Semiconductor substrate, substrate inspection method, semiconductor device manufacturing method, and inspection apparatusTOSHIBA KK·Filed 2009·Granted Jul 5, 2011·57 cites·18 claims
- 0295US7573066B2Semiconductor substrate, substrate inspection method, semiconductor device manufacturing method, and inspection apparatusTOSHIBA KK·Filed 2007·Granted Aug 11, 2009·59 cites·2 claims
- 0392US7221991B2System and method for monitoring manufacturing apparatusesTOSHIBA KK·Filed 2005·Granted May 22, 2007·24 cites·9 claims
- 0483US7197414B2System and method for identifying a manufacturing tool causing a faultTOSHIBA KK·Filed 2005·Granted Mar 27, 2007·14 cites·19 claims
- 0577US8081814B2Linear pattern detection method and apparatusMATSUSHITA HIROSHI·Filed 2009·Granted Dec 20, 2011·15 cites·17 claims
- 0673US7043384B2Failure detection system, failure detection method, and computer program productTOSHIBA KK·Filed 2004·Granted May 9, 2006·21 cites·20 claims
- 0770US7405088B2Method for analyzing fail bit maps of waters and apparatus thereforTOSHIBA KK·Filed 2004·Granted Jul 29, 2008·13 cites·15 claims
- 0866US6916507B2Aqueous water repellent for substrate treatment, making method, preparation of modified plywood or modified laminated veneer lumber, and preparation of wooden fiberboardSUMITOMO FORESTRY·Filed 2003·Granted Jul 12, 2005·13 cites·21 claims
- 0962US7138283B2Method for analyzing fail bit maps of wafersTOSHIBA KK·Filed 2004·Granted Nov 21, 2006·12 cites·19 claims
- 1060US8170707B2Failure detecting method, failure detecting apparatus, and semiconductor device manufacturing methodMATSUSHITA HIROSHI·Filed 2008·Granted May 1, 2012·3 cites·9 claims
- 1160US6975953B2Analysis method for semiconductor device, analysis system and a computer program productTOSHIBA KK·Filed 2004·Granted Dec 13, 2005·7 cites·20 claims
- 1256US7062409B2System for, method of and computer program product for detecting failure of manufacturing apparatusesTOSHIBA KK·Filed 2003·Granted Jun 13, 2006·5 cites·22 claims
- 1352US11594514B2Semiconductor device and method of manufacturing the sameKIOXIA CORP·Filed 2020·Granted Feb 28, 2023·0 cites·9 claims
- 1448US11355513B2Semiconductor storage deviceKIOXIA CORP·Filed 2020·Granted Jun 7, 2022·0 cites·17 claims
- 1547US2023116483A1Method for producing pha using sea waterSUMITOMO FORESTRY·Filed 2021·Application pending·0 cites
- 1644US11195855B2Semiconductor memory device and method of manufacturing the sameKIOXIA CORP·Filed 2020·Granted Dec 7, 2021·0 cites·14 claims
- 1743US2014236337A1Pattern inspection method and manufacturing control systemTOSHIBA KK·Filed 2013·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →