Inventor · disambiguated record
Yossi Simon
Also filed as: SIMON YOSSI · SIMON YOSSI BEN
11 granted patents·2 pending applications·10 citations·filing 2011–2023
83Inventor score
Top patents by PatentIndex Score
13 records- 0193US11899375B2Massive overlay metrology sampling with multiple measurement columnsKLA CORP·Filed 2021·Granted Feb 13, 2024·2 cites·56 claims
- 0292US12001148B2Enhancing performance of overlay metrologyKLA CORP·Filed 2023·Granted Jun 4, 2024·2 cites·26 claims
- 0386US11556738B2System and method for determining target feature focus in image-based overlay metrologyKLA CORP·Filed 2020·Granted Jan 17, 2023·2 cites·21 claims
- 0483US11592755B2Enhancing performance of overlay metrologyKLA CORP·Filed 2021·Granted Feb 28, 2023·1 cites·30 claims
- 0580US12379669B2Massive overlay metrology sampling with multiple measurement columnsKLA CORP·Filed 2023·Granted Aug 5, 2025·0 cites·33 claims
- 0679US10684563B2On the fly target acquisitionKLA TENCOR CORP·Filed 2018·Granted Jun 16, 2020·3 cites·19 claims
- 0770US11921825B2System and method for determining target feature focus in image-based overlay metrologyKLA CORP·Filed 2023·Granted Mar 5, 2024·0 cites·21 claims
- 0862US2025138435A1Massive measurement sampling using multiple chucks and optical columnsKLA CORP·Filed 2023·Application pending·0 cites
- 0959US2024094639A1High-resolution evaluation of optical metrology targets for process controlKLA CORP·Filed 2022·Application pending·0 cites
- 1053US12131959B2Systems and methods for improved metrology for semiconductor device wafersKLA CORP·Filed 2021·Granted Oct 29, 2024·0 cites·24 claims
- 1148US12222199B2Systems and methods for measurement of misregistration and amelioration thereofKLA CORP·Filed 2020·Granted Feb 11, 2025·0 cites·22 claims
- 1244US11933717B2Sensitive optical metrology in scanning and static modesKLA CORP·Filed 2019·Granted Mar 19, 2024·0 cites·32 claims
- 1341US9367080B2Apparatus, system, and method for providing clock signal on demandGENDLER ALEXANDER·Filed 2011·Granted Jun 14, 2016·0 cites·14 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →