Inventor · disambiguated record
Chandler Mcdowell
Also filed as: MCDOWELL CHANDLER T · MCDOWELL CHANDLER TODD
18 granted patents·4 pending applications·258 citations·filing 2001–2021
94Inventor score
Top patents by PatentIndex Score
22 records- 0192US6754092B2Method and apparatus for reducing power consumption for power supplied by a voltage adapterIBM·Filed 2002·Granted Jun 22, 2004·86 cites·21 claims
- 0290US6494048B1Assembly of quantum cold point thermoelectric coolers using magnetsIBM·Filed 2002·Granted Dec 17, 2002·47 cites·24 claims
- 0388US6769774B2Ambient light tolerant image projection method and systemIBM·Filed 2002·Granted Aug 3, 2004·29 cites·21 claims
- 0487US7408372B2Method and apparatus for measuring device mismatchesIBM·Filed 2006·Granted Aug 5, 2008·13 cites·6 claims
- 0583US7446550B2Enhanced signal observability for circuit analysisIBM·Filed 2007·Granted Nov 4, 2008·10 cites·14 claims
- 0676US7046094B2Method and ring oscillator circuit for measuring circuit delays over a wide operating rangeIBM·Filed 2004·Granted May 16, 2006·19 cites·20 claims
- 0775US6731129B1Apparatus for measuring capacitance of a semiconductor deviceIBM·Filed 2002·Granted May 4, 2004·18 cites·21 claims
- 0859US7284029B24-to-2 carry save adder using limited switching dynamic logicIBM·Filed 2003·Granted Oct 16, 2007·6 cites·18 claims
- 0959US6679625B2Scanning heat flow probeIBM·Filed 2001·Granted Jan 20, 2004·6 cites·8 claims
- 1058US2004068518A1Layered virtual identity system and methodIBM·Filed 2002·Application pending·0 cites
- 1157US7622942B2Method and apparatus for measuring device mismatchesIBM·Filed 2008·Granted Nov 24, 2009·2 cites·14 claims
- 1255US7383480B2Scanning latches using selecting arrayIBM·Filed 2004·Granted Jun 3, 2008·6 cites·7 claims
- 1355US7355419B2Enhanced signal observability for circuit analysisIBM·Filed 2004·Granted Apr 8, 2008·5 cites·8 claims
- 1454US2021206430A1Automated Steering Control Mechanism and System for Wheeled VehiclesEVA LLC·Filed 2021·Application pending·0 cites
- 1552US6652139B2Scanning heat flow probe and the method of fabricating the sameIBM·Filed 2003·Granted Nov 25, 2003·3 cites·8 claims
- 1651US7047468B2Method and apparatus for low overhead circuit scanIBM·Filed 2003·Granted May 16, 2006·5 cites·10 claims
- 1749US6817761B2Scanning heat flow probeIBM·Filed 2003·Granted Nov 16, 2004·2 cites·4 claims
- 1847US7216141B2Computing carry-in bit to most significant bit carry save adder in current stageIBM·Filed 2003·Granted May 8, 2007·0 cites·19 claims
- 1947US6866415B2Scanning heat flow probeIBM·Filed 2003·Granted Mar 15, 2005·1 cites·5 claims
- 2041US2008163019A1Scanning Latches Using Selecting ArrayMARTIN ANDREW KENNETH·Filed 2008·Application pending·0 cites
- 2141US2008144400A1Scanning Latches Using Selecting ArrayMARTIN ANDREW KENNETH·Filed 2008·Application pending·0 cites
- 2235US7667513B2Digital duty cycle correctorIBM·Filed 2004·Granted Feb 23, 2010·0 cites·8 claims
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