Inventor · disambiguated record
Ralph G. Whitten
Also filed as: WHITTEN RALPH · WHITTEN RALPH G
33 granted patents·4 pending applications·2,294 citations·filing 1986–2025
98Inventor score
Top patents by PatentIndex Score
37 records- 0199US6690185B1Large contactor with multiple, aligned contactor unitsFORMFACTOR INC·Filed 1998·Granted Feb 10, 2004·268 cites·8 claims
- 0298US10453321B2Pre-smoke detector and system for use in early detection of developing firesNEVADA NANOTECH SYSTEMS INC·Filed 2018·Granted Oct 22, 2019·18 cites·23 claims
- 0398US9922517B2Pre-smoke detector and system for use in early detection of developing firesNEVADA NANOTECH SYSTEMS INC·Filed 2016·Granted Mar 20, 2018·15 cites·22 claims
- 0497US9547968B2Pre-smoke detector and system for use in early detection of developing firesADAMS JESSE D·Filed 2011·Granted Jan 17, 2017·25 cites·31 claims
- 0597US6825052B2Test assembly including a test die for testing a semiconductor product dieFORMFACTOR INC·Filed 2002·Granted Nov 30, 2004·114 cites·17 claims
- 0697US6621260B2Special contact points for accessing internal circuitry of an integrated circuitFORMFACTOR INC·Filed 2000·Granted Sep 16, 2003·98 cites·17 claims
- 0797US6597187B2Special contact points for accessing internal circuitry of an integrated circuitFORMFACTOR INC·Filed 2000·Granted Jul 22, 2003·99 cites·23 claims
- 0897US6456099B1Special contact points for accessing internal circuitry of an integrated circuitFORMFACTOR INC·Filed 1998·Granted Sep 24, 2002·183 cites·26 claims
- 0997US5661592AMethod of making and an apparatus for a flat diffraction grating light valveSILICON LIGHT MACHINES INC·Filed 1995·Granted Aug 26, 1997·308 cites·18 claims
- 1096US6603324B2Special contact points for accessing internal circuitry of an integrated circuitFORMFACTOR INC·Filed 2000·Granted Aug 5, 2003·84 cites·20 claims
- 1196US6429029B1Concurrent design and subsequent partitioning of product and test dieFORMFACTOR INC·Filed 1998·Granted Aug 6, 2002·215 cites·49 claims
- 1295US10724976B2Systems and methods for determining at least one property of a materialNEVADA NANOTECH SYSTEMS INC·Filed 2017·Granted Jul 28, 2020·13 cites·47 claims
- 1395US6476630B1Method for testing signal paths between an integrated circuit wafer and a wafer testerFORMFACTOR INC·Filed 2000·Granted Nov 5, 2002·89 cites·14 claims
- 1493US6551844B1Test assembly including a test die for testing a semiconductor product dieFORMFACTOR INC·Filed 1998·Granted Apr 22, 2003·109 cites·18 claims
- 1593US4796075AFusible link structure for integrated circuitsADVANCED MICRO DEVICES INC·Filed 1986·Granted Jan 3, 1989·109 cites·15 claims
- 1689US5341267AStructures for electrostatic discharge protection of electrical and other componentsAPTIX CORP·Filed 1991·Granted Aug 23, 1994·112 cites·16 claims
- 1788US6940093B2Special contact points for accessing internal circuitry of an integrated circuitFORMFACTOR INC·Filed 2000·Granted Sep 6, 2005·30 cites·40 claims
- 1888US5903041AIntegrated two-terminal fuse-antifuse and fuse and integrated two-terminal fuse-antifuse structures incorporating an air gapAPTIX CORP·Filed 1994·Granted May 11, 1999·139 cites·52 claims
- 1987US2025347645A1Methods for determining at least one property of a materialNEVADA NANOTECH SYSTEMS INC·Filed 2025·Application pending·0 cites
- 2085US12385876B2Methods of operating and calibrating a gas sensor, and related gas sensorsNEVADA NANOTECH SYSTEMS INC·Filed 2020·Granted Aug 12, 2025·1 cites·19 claims
- 2184US12372488B2Methods for determining at least one property of a material, and related detectorNEVADA NANOTECH SYSTEMS INC·Filed 2023·Granted Jul 29, 2025·0 cites·20 claims
- 2282US7557596B2Test assembly including a test die for testing a semiconductor product dieFORMFACTOR INC·Filed 2004·Granted Jul 7, 2009·24 cites·22 claims
- 2382US2025369919A1Methods of operating and calibrating a gas sensor, and related gas sensorsNEVADA NANOTECH SYSTEMS INC·Filed 2025·Application pending·0 cites
- 2481US5502315AElectrically programmable interconnect structure having a PECVD amorphous silicon elementQUICKLOGIC CORP·Filed 1993·Granted Mar 26, 1996·58 cites·5 claims
- 2579US5780919AElectrically programmable interconnect structure having a PECVD amorphous silicon elementQUICKLOGIC CORP·Filed 1996·Granted Jul 14, 1998·47 cites·3 claims
- 2678US9625401B2Molecular analysis using micro electro-mechanical sensor devicesNEVADA NANOTECH SYSTEMS INC·Filed 2013·Granted Apr 18, 2017·3 cites·20 claims
- 2778US6724209B1Method for testing signal paths between an integrated circuit wafer and a wafer testerFiled 2000·Granted Apr 20, 2004·18 cites·26 claims
- 2872US11709142B2Methods for determining at least one property of a materialNEVADA NANOTECH SYSTEMS INC·Filed 2020·Granted Jul 25, 2023·0 cites·35 claims
- 2972US11262321B2Systems and methods for determining at least one property of a materialNEVADA NANOTECH SYSTEMS INC·Filed 2020·Granted Mar 1, 2022·0 cites·25 claims
- 3069US5451811AElectrically programmable interconnect element for integrated circuitsAPTIX CORP·Filed 1994·Granted Sep 19, 1995·40 cites·23 claims
- 3158US5412261ATwo-stage programmable interconnect architectureAPTIX CORP·Filed 1992·Granted May 2, 1995·27 cites·34 claims
- 3255US7053637B2Method for testing signal paths between an integrated circuit wafer and a wafer testerFORMFACTOR INC·Filed 2004·Granted May 30, 2006·5 cites·9 claims
- 3354US5717230AField programmable gate array having reproducible metal-to-metal amorphous silicon antifusesQUICKLOGIC CORP·Filed 1994·Granted Feb 10, 1998·19 cites·11 claims
- 3454US2017153193A1Molecular analysis using micro electro-mechanical sensor devicesNEVADA NANOTECH SYSTEMS INC·Filed 2017·Application pending·0 cites
- 3552US5989943AMethod for fabrication of programmable interconnect structureQUICKLOGIC CORP·Filed 1989·Granted Nov 23, 1999·13 cites·17 claims
- 3650US2006006384A1Special contact points for accessing internal circuitry of an intergrated circuitFORMFACTOR INC·Filed 2005·Application pending·0 cites
- 3748US6150199AMethod for fabrication of programmable interconnect structureQUICKLOGIC CORP·Filed 1999·Granted Nov 21, 2000·11 cites·2 claims
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