Inventor · disambiguated record
Kenichi Narikawa
Also filed as: NARIKAWA KENICHI
6 granted patents·4 pending applications·14 citations·filing 1974–2025
73Inventor score
Top patents by PatentIndex Score
10 records- 0176US10859601B2Device inspection circuit, device inspection device, and probe cardTOKYO ELECTRON LTD·Filed 2017·Granted Dec 8, 2020·2 cites·9 claims
- 0265US7733113B2Semiconductor test deviceYOKOGAWA ELECTRIC CORP·Filed 2008·Granted Jun 8, 2010·3 cites·5 claims
- 0352US2025181142A1Support Device, Support System, and Support MethodTOKYO ELECTRON LTD·Filed 2025·Application pending·0 cites
- 0449US2024345155A1Test method of test system and test systemTOKYO ELECTRON LTD·Filed 2022·Application pending·0 cites
- 0545US10114070B2Substrate inspection apparatusTOKYO ELECTRON LTD·Filed 2014·Granted Oct 30, 2018·0 cites·3 claims
- 0641US3950467AMethod for shaping tubular films in downward and wet mannerPOLYMER PROCESSING RES INST·Filed 1974·Granted Apr 13, 1976·9 cites·2 claims
- 0740US11454664B2Testing systemTOKYO ELECTRON LTD·Filed 2018·Granted Sep 27, 2022·0 cites·20 claims
- 0835US11293978B2Voltage application device for testing plurality of devices and method of forming output voltage waveformTOKYO ELECTRON LTD·Filed 2018·Granted Apr 5, 2022·0 cites·10 claims
- 0933US2019128952A1Substrate inspection apparatusTOKYO ELECTRON LTD·Filed 2018·Application pending·0 cites
- 1032US2010289332A1Power supply and semiconductor test device using the sameYOKOGAWA ELECTRIC CORP·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →