Inventor · disambiguated record
Takanori Hyakudomi
Also filed as: HYAKUDOMI TAKANORI
9 granted patents·65 citations·filing 2001–2019
84Inventor score
Files withTOKYO ELECTRON LTD9
Top patents by PatentIndex Score
9 records- 0184US6739208B2Method of delivering target object to be processed, table mechanism of target object and probe apparatusTOKYO ELECTRON LTD·Filed 2001·Granted May 25, 2004·37 cites·10 claims
- 0282US7221177B2Probe apparatus with optical length-measuring unit and probe testing methodTOKYO ELECTRON LTD·Filed 2005·Granted May 22, 2007·11 cites·17 claims
- 0377US7477064B2Probing apparatus and positional deviation acquiring methodTOKYO ELECTRON LTD·Filed 2006·Granted Jan 13, 2009·10 cites·7 claims
- 0475US7397257B2Detection method/device of probe's tip location using a transparent film attached to a substate having plurality of electrodes, and a storage medium for implementing the methodTOKYO ELECTRON LTD·Filed 2007·Granted Jul 8, 2008·5 cites·16 claims
- 0572US11099236B2Inspection device and contact methodTOKYO ELECTRON LTD·Filed 2018·Granted Aug 24, 2021·1 cites·18 claims
- 0661US9863977B2Method of contacting substrate with probe cardTOKYO ELECTRON LTD·Filed 2013·Granted Jan 9, 2018·1 cites·8 claims
- 0743US7679387B2Inspection method, inspection apparatus, and control program for performing electrical inspection by using probeTOKYO ELECTRON LTD·Filed 2007·Granted Mar 16, 2010·0 cites·13 claims
- 0840US11454664B2Testing systemTOKYO ELECTRON LTD·Filed 2018·Granted Sep 27, 2022·0 cites·20 claims
- 0939US11360115B2Inspection systemTOKYO ELECTRON LTD·Filed 2019·Granted Jun 14, 2022·0 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →