Inventor · disambiguated record
Tetsuya Kagami
Also filed as: KAGAMI TETSUYA
12 granted patents·3 pending applications·511 citations·filing 1994–2018
92Inventor score
Top patents by PatentIndex Score
15 records- 0189US6529802B1Robot and information processing systemSONY CORP·Filed 1999·Granted Mar 4, 2003·164 cites·11 claims
- 0285US11009544B2Inspection system, wafer map display, wafer map display method, and computer programTOKYO ELECTRON LTD·Filed 2018·Granted May 18, 2021·3 cites·17 claims
- 0385US5991721AApparatus and method for processing natural language and apparatus and method for speech recognitionSONY CORP·Filed 1996·Granted Nov 23, 1999·125 cites·29 claims
- 0482US11187747B2Inspection system and malfunction analysis/prediction method for inspection systemTOKYO ELECTRON LTD·Filed 2018·Granted Nov 30, 2021·3 cites·16 claims
- 0577US5903867AInformation access system and recording systemSONY CORP·Filed 1994·Granted May 11, 1999·63 cites·18 claims
- 0667US5848389ASpeech recognizing method and apparatus, and speech translating systemSONY CORP·Filed 1996·Granted Dec 8, 1998·55 cites·13 claims
- 0764US5963892ATranslation apparatus and method for facilitating speech input operation and obtaining correct translation thereofSONY CORP·Filed 1996·Granted Oct 5, 1999·45 cites·34 claims
- 0862US6431544B1Puzzle for reconstructing an overall pictureFiled 2000·Granted Aug 13, 2002·8 cites·13 claims
- 0958US6161093AInformation access system and recording mediumSONY CORP·Filed 1998·Granted Dec 12, 2000·29 cites·57 claims
- 1048US10871516B2Inspection systemTOKYO ELECTRON LTD·Filed 2018·Granted Dec 22, 2020·0 cites·13 claims
- 1143US7912696B1Natural language processing apparatus and natural language processing methodSONY CORP·Filed 1999·Granted Mar 22, 2011·16 cites·25 claims
- 1241US2021364550A1Testing system and testing methodTOKYO ELECTRON LTD·Filed 2018·Application pending·0 cites
- 1341US2020174073A1Device inspection methodTOKYO ELECTRON LTD·Filed 2018·Application pending·0 cites
- 1440US11454664B2Testing systemTOKYO ELECTRON LTD·Filed 2018·Granted Sep 27, 2022·0 cites·20 claims
- 1531US2017256324A1Device inspection method, probe card, interposer, and inspection apparatusTOKYO ELECTRON LTD·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →