Inventor · disambiguated record
Changsoo Hong
Also filed as: HONG CHANGSOO
14 granted patents·81 citations·filing 2008–2016
91Inventor score
Top patents by PatentIndex Score
14 records- 0193US9831232B2ESD protection deviceFREESCALE SEMICONDUCTOR INC·Filed 2016·Granted Nov 28, 2017·11 cites·9 claims
- 0290US8531005B2Devices with zener triggered ESD protectionWHITFIELD JAMES D·Filed 2012·Granted Sep 10, 2013·13 cites·9 claims
- 0389US8994068B2ESD protection deviceZHAN ROUYING·Filed 2012·Granted Mar 31, 2015·12 cites·19 claims
- 0488US9786652B2ESD protection with asymmetrical bipolar-based deviceZHAN ROUYING·Filed 2015·Granted Oct 10, 2017·6 cites·20 claims
- 0585US9018072B2ESD protection device and methodGENDRON AMAURY·Filed 2014·Granted Apr 28, 2015·7 cites·18 claims
- 0684US9583603B2ESD protection with integrated LDMOS triggering junctionZHAN ROUYING·Filed 2013·Granted Feb 28, 2017·6 cites·21 claims
- 0782US9177952B2ESD protection with asymmetrical bipolar-based deviceZHAN ROUYING·Filed 2013·Granted Nov 3, 2015·5 cites·18 claims
- 0879US8648419B2ESD protection device and methodGENDRON AMAURY·Filed 2010·Granted Feb 11, 2014·5 cites·20 claims
- 0979US7723823B2Buried asymmetric junction ESD protection deviceFREESCALE SEMICONDUCTOR INC·Filed 2008·Granted May 25, 2010·8 cites·20 claims
- 1076US10211058B2ESD protection deviceFREESCALE SEMICONDUCTOR INC·Filed 2015·Granted Feb 19, 2019·3 cites·20 claims
- 1166US8252656B2Zener triggered ESD protectionWHITFIELD JAMES D·Filed 2009·Granted Aug 28, 2012·3 cites·20 claims
- 1264US9019667B2Protection device and related fabrication methodsFREESCALE SEMICONDUCTOR INC·Filed 2012·Granted Apr 28, 2015·2 cites·20 claims
- 1345US10483257B2Low voltage NPN with low trigger voltage and high snap back voltage for ESD protectionFREESCALE SEMICONDUCTOR INC·Filed 2014·Granted Nov 19, 2019·0 cites·11 claims
- 1445US10002861B2ESD protection structureFREESCALE SEMICONDUCTOR INC·Filed 2016·Granted Jun 19, 2018·0 cites·11 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →