Inventor · disambiguated record
Sandeep Bhagwat
Also filed as: BHAGWAT SANDEEP
5 granted patents·176 citations·filing 2003–2024
81Inventor score
Top patents by PatentIndex Score
5 records- 0190US6718526B1Spatial signature analysisKLA TENCOR CORP·Filed 2003·Granted Apr 6, 2004·100 cites·20 claims
- 0281US7142992B1Flexible hybrid defect classification for semiconductor manufacturingKLA TENCOR TECH CORP·Filed 2004·Granted Nov 28, 2006·28 cites·19 claims
- 0381US7093207B1Data analysis flow engineKLA TENCOR TECH CORP·Filed 2003·Granted Aug 15, 2006·46 cites·16 claims
- 0476US11055840B2Semiconductor hot-spot and process-window discovery combining optical and electron-beam inspectionKLA CORP·Filed 2019·Granted Jul 6, 2021·2 cites·19 claims
- 0558US12387310B2Wafer signature local maxima via clustering for metrology guided inspectionKLA CORP·Filed 2024·Granted Aug 12, 2025·0 cites·20 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →