Inventor · disambiguated record
Hong Hocheng
Also filed as: HOCHENG HONG
8 granted patents·6 pending applications·96 citations·filing 1999–2016
87Inventor score
Top patents by PatentIndex Score
14 records- 0184US8755571B2Image method for classifying insects and classifying process for insectsTSAI HUNG-YIN·Filed 2012·Granted Jun 17, 2014·17 cites·6 claims
- 0274US6315885B1Method and apparatus for electropolishing aided by ultrasonic energy meansNAT SCIENCE COUNCIL·Filed 1999·Granted Nov 13, 2001·29 cites·16 claims
- 0372US6909998B2In-situ monitoring method and system for mold deformation in nanoimprintFiled 2003·Granted Jun 21, 2005·13 cites·34 claims
- 0471US7303703B2Nano-imprint system with mold deformation detector and method of monitoring the sameHOCHENG HONG·Filed 2004·Granted Dec 4, 2007·13 cites·14 claims
- 0568US8985056B2Detecting platform for holding a tiny insectChen rong-shun·Filed 2012·Granted Mar 24, 2015·5 cites·7 claims
- 0665US6872662B1Method for detecting the endpoint of a chemical mechanical polishing (CMP) processFiled 2003·Granted Mar 29, 2005·14 cites·16 claims
- 0752US7682552B2Capacitive measurement method and system for nanoimprint process monitoringIND TECH RES INST·Filed 2004·Granted Mar 23, 2010·4 cites·6 claims
- 0849US9162294B2Apparatus and method for delamination reduction of composite materialsHOCHENG HONG·Filed 2012·Granted Oct 20, 2015·1 cites·5 claims
- 0948US2006121641A1Apparatus and method for fabricating nano/micro structureHONG HOCHENG·Filed 2005·Application pending·0 cites
- 1044US2016270378A1System for classifying tiny insectsNAT UNIV TSING HUA·Filed 2016·Application pending·0 cites
- 1141US2013081573A1System for classifying tiny insectsChen rong-shun·Filed 2012·Application pending·0 cites
- 1239US2006158708A1Apparatus and method for fabricating three-dimensional nano/micro structuresHONG HOCHENG·Filed 2005·Application pending·0 cites
- 1337US2011157591A1Monitoring apparatus and method for nano-transfer printing processHOCHENG HONG·Filed 2010·Application pending·0 cites
- 1435US2011134440A1Monitoring apparatus and method for uniformity and residual thickness of nano-transfer printing processHOCHENG HONG·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →