Inventor · disambiguated record
Dirk Preikszas
Also filed as: PREIKSZAS DIRK
35 granted patents·7 pending applications·336 citations·filing 1992–2024
96Inventor score
Technology areasH01J
Files withZEISS CARL MICROSCOPY GMBH19PREIKSZAS DIRK11ZEISS CARL NTS GMBH6BENNER GERD2CARL ZEISS MULTISEM GMBH1
Top patents by PatentIndex Score
42 records- 0195US6855938B2Objective lens for an electron microscopy system and electron microscopy systemZEISS CARL NTS GMBH·Filed 2003·Granted Feb 15, 2005·97 cites·51 claims
- 0294US8304750B2Scanning charged particle beamsPREIKSZAS DIRK·Filed 2008·Granted Nov 6, 2012·51 cites·30 claims
- 0393US8129693B2Charged particle beam column and method of operating samePREIKSZAS DIRK·Filed 2009·Granted Mar 6, 2012·19 cites·18 claims
- 0491US11380519B1Operating a particle beam generator for a particle beam deviceZEISS CARL MICROSCOPY GMBH·Filed 2020·Granted Jul 5, 2022·2 cites·20 claims
- 0590US5319207AImaging system for charged particlesZEISS STIFTUNG·Filed 1992·Granted Jun 7, 1994·64 cites·25 claims
- 0686US9953804B2High-voltage supply unit and circuit arrangement for generating a high voltage for a particle beam apparatusZEISS CARL MICROSCOPY GMBH·Filed 2016·Granted Apr 24, 2018·5 cites·18 claims
- 0786US7425701B2Electron-beam device and detector systemZEISS CARL NTS GMBH·Filed 2004·Granted Sep 16, 2008·20 cites·20 claims
- 0885US8405045B2Particle beam device with deflection systemPREIKSZAS DIRK·Filed 2011·Granted Mar 26, 2013·8 cites·20 claims
- 0981US9093246B2SACP method and particle optical system for performing the methodPREIKSZAS DIRK·Filed 2010·Granted Jul 28, 2015·5 cites·38 claims
- 1081US7910887B2Electron-beam device and detector systemZEISS CARL NTS GMBH·Filed 2009·Granted Mar 22, 2011·4 cites·23 claims
- 1180US11087949B2Particle-optical apparatus and particle beam systemZEISS CARL MICROSCOPY GMBH·Filed 2020·Granted Aug 10, 2021·1 cites·24 claims
- 1280US10699869B2Operating a particle beam apparatusZEISS CARL MICROSCOPY GMBH·Filed 2019·Granted Jun 30, 2020·3 cites·23 claims
- 1380US7507962B2Electron-beam device and detector systemZEISS CARL NTS GMBH·Filed 2006·Granted Mar 24, 2009·4 cites·13 claims
- 1480US6855939B2Particle beam system having a mirror correctorLEO ELEKTRONENMIKROSKOPIE GMBH·Filed 2003·Granted Feb 15, 2005·21 cites·27 claims
- 1578US9859092B2Particle beam microscope and method for operating a particle beam microscopeZEISS CARL MICROSCOPY GMBH·Filed 2016·Granted Jan 2, 2018·2 cites·27 claims
- 1677US8476589B2Particle beam microscopeBENNER GERD·Filed 2012·Granted Jul 2, 2013·5 cites·19 claims
- 1771US10755889B2Particle-optical apparatus and particle beam systemZEISS CARL MICROSCOPY GMBH·Filed 2018·Granted Aug 25, 2020·1 cites·25 claims
- 1871US10546717B2High-voltage supply unit and circuit arrangement for generating a high voltage for a particle beam apparatusZEISS CARL MICROSCOPY GMBH·Filed 2018·Granted Jan 28, 2020·1 cites·19 claims
- 1970US7022987B2Particle-optical arrangements and particle-optical systemsZEISS CARL NTS GMBH·Filed 2003·Granted Apr 4, 2006·8 cites·43 claims
- 2069US8217350B2Particle optical arrangementPREIKSZAS DIRK·Filed 2007·Granted Jul 10, 2012·2 cites·12 claims
- 2167US11139140B2Particle beam apparatus having an aperture unit and method for setting a beam current in a particle beam apparatusPREIKSZAS DIRK·Filed 2010·Granted Oct 5, 2021·2 cites·30 claims
- 2267US10062542B2Particle beam microscope and method for operating a particle beam microscopeZEISS CARL MICROSCOPY GMBH·Filed 2016·Granted Aug 28, 2018·1 cites·20 claims
- 2366US8421028B2Device for deflecting or guiding in a particle beamPREIKSZAS DIRK·Filed 2008·Granted Apr 16, 2013·1 cites·37 claims
- 2463US2024371597A1Multipole element, image error corrector and particle beam systemZEISS CARL MICROSCOPY GMBH·Filed 2024·Application pending·0 cites
- 2562US7523009B2Control of instrumentsZEISS CARL NTS GMBH·Filed 2003·Granted Apr 21, 2009·8 cites·34 claims
- 2662US2024302542A1Particle beam microscopeZEISS CARL MICROSCOPY GMBH·Filed 2024·Application pending·0 cites
- 2761US9312093B1Particle beam device comprising an electrode unitZEISS CARL MICROSCOPY GMBH·Filed 2014·Granted Apr 12, 2016·1 cites·21 claims
- 2860US2024258065A1Method of operating a particle beam system and computer program productZEISS CARL MICROSCOPY GMBH·Filed 2024·Application pending·0 cites
- 2956US11915907B2Method for operating a particle beam microscopeZEISS CARL MICROSCOPY GMBH·Filed 2022·Granted Feb 27, 2024·0 cites·20 claims
- 3055US12288664B2Particle beam device having a deflection unitZEISS CARL MICROSCOPY GMBH·Filed 2022·Granted Apr 29, 2025·0 cites·15 claims
- 3154US8558190B2Charged particle beam column and method of operating samePREIKSZAS DIRK·Filed 2011·Granted Oct 15, 2013·0 cites·20 claims
- 3254US8063364B2Particle optical device with magnet assemblyPREIKSZAS DIRK·Filed 2009·Granted Nov 22, 2011·0 cites·26 claims
- 3353US12512291B2Particle beam system having a multi-pole lens sequence for independently focusing a multiplicity of individual particle beams, and its use and associated methodCARL ZEISS MULTISEM GMBH·Filed 2022·Granted Dec 30, 2025·0 cites·21 claims
- 3444US10629404B2Method for adjusting a particle beam microscopeZEISS CARL MICROSCOPY GMBH·Filed 2018·Granted Apr 21, 2020·0 cites·20 claims
- 3542US2012305797A1Method and particle beam device for focusing a particle beamPREIKSZAS DIRK·Filed 2012·Application pending·0 cites
- 3640US10854421B2Charged particle beam system and methodZEISS CARL MICROSCOPY GMBH·Filed 2019·Granted Dec 1, 2020·0 cites·24 claims
- 3740US2011215242A1Particle beam device and method for operation of a particle beam devicePREIKSZAS DIRK·Filed 2011·Application pending·0 cites
- 3837US10665423B2Analyzing energy of charged particlesZEISS CARL MICROSCOPY GMBH·Filed 2016·Granted May 26, 2020·0 cites·17 claims
- 3937US2012326030A1Particle Beam MicroscopeBENNER GERD·Filed 2011·Application pending·0 cites
- 4031US2016020064A1Apparatus for focusing and for storage of ions and for separation of pressure areasZEISS CARL MICROSCOPY GMBH·Filed 2015·Application pending·0 cites
- 4130US9947504B2Particle beam apparatus and method for operating a particle beam apparatusZEISS CARL MICROSCOPY GMBH·Filed 2016·Granted Apr 17, 2018·0 cites·20 claims
- 4229US9230789B2Printed circuit board multipole for ion focusingLAUE ALEXANDER·Filed 2011·Granted Jan 5, 2016·0 cites·17 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →