Inventor · disambiguated record
Adam Baer
Also filed as: BAER ADAM
6 granted patents·36 citations·filing 2004–2014
79Inventor score
Top patents by PatentIndex Score
6 records- 0184US8207504B2Inspection of EUV masks by a DUV mask inspection toolBRAUDE CHAIM·Filed 2010·Granted Jun 26, 2012·9 cites·19 claims
- 0276US7315364B2System for inspecting a surface employing configurable multi angle illumination modesAPPLIED MATERIALS ISRAEL LTD·Filed 2005·Granted Jan 1, 2008·6 cites·12 claims
- 0371US7239389B2Determination of irradiation parameters for inspection of a surfaceAPPLIED MATERIALS ISRAEL LTD·Filed 2004·Granted Jul 3, 2007·16 cites·27 claims
- 0469US8659754B2Inspection system and method for fast changes of focusAPPLIED MATERIALS ISRAEL LTD·Filed 2013·Granted Feb 25, 2014·2 cites·7 claims
- 0567US8488117B2Inspection system and method for fast changes of focusFELDMAN HAIM·Filed 2011·Granted Jul 16, 2013·3 cites·18 claims
- 0648US9395266B2On-tool wavefront aberrations measurement system and methodAPPLIED MATERIALS ISRAEL LTD·Filed 2014·Granted Jul 19, 2016·0 cites·15 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →