Inventor · disambiguated record
Jochen Kallscheuer
Also filed as: KALLSCHEUER JOCHEN
6 granted patents·3 pending applications·32 citations·filing 2002–2008
79Inventor score
Files withINFINEON TECHNOLOGIES AG5INFINEON TECHNOLGIES AG1KALLSCHEUER JOCHEN1QIMONDA AG1STRACKE PATRIC1
Top patents by PatentIndex Score
9 records- 0167US7283419B2Integrated semiconductor memoryINFINEON TECHNOLOGIES AG·Filed 2006·Granted Oct 16, 2007·7 cites·12 claims
- 0256US6858447B2Method for testing semiconductor chipsINFINEON TECHNOLOGIES AG·Filed 2002·Granted Feb 22, 2005·7 cites·7 claims
- 0353US6728147B2Method for on-chip testing of memory cells of an integrated memory circuitINFINEON TECHNOLOGIES AG·Filed 2002·Granted Apr 27, 2004·8 cites·12 claims
- 0448US6977516B2Semi-conductor component testing system with a reduced number of test channelsINFINEON TECHNOLGIES AG·Filed 2003·Granted Dec 20, 2005·8 cites·11 claims
- 0545US7454676B2Method for testing semiconductor chips using register setsINFINEON TECHNOLOGIES AG·Filed 2005·Granted Nov 18, 2008·2 cites·19 claims
- 0633US2007066367A1Method and arrangement for repairing memory chips using microlithography methodsKALLSCHEUER JOCHEN·Filed 2004·Application pending·0 cites
- 0731US7461308B2Method for testing semiconductor chips by means of bit masksINFINEON TECHNOLOGIES AG·Filed 2005·Granted Dec 2, 2008·0 cites·22 claims
- 0831US2006156108A1Method for testing semiconductor chips using check bitsSTRACKE PATRIC·Filed 2005·Application pending·0 cites
- 0929US2008231303A1Semiconductor device for electrical contacting semiconductor devicesQIMONDA AG·Filed 2008·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →