Inventor · disambiguated record
Kazuo Matsuzaki
Also filed as: MATSUZAKI KAZUO
27 granted patents·2 pending applications·530 citations·filing 1978–2011
97Inventor score
Top patents by PatentIndex Score
29 records- 0191US5519582AMagnetic induction coil for semiconductor devicesFUJI ELECTRIC CO LTD·Filed 1995·Granted May 21, 1996·126 cites·8 claims
- 0286US5864182ABattery mounted integrated circuit deviceFUJI ELECTRIC CO LTD·Filed 1993·Granted Jan 26, 1999·84 cites·9 claims
- 0380US5604383AStabilized power supply device using a flip chip as an active componentFUJI ELECTRIC CO LTD·Filed 1995·Granted Feb 18, 1997·65 cites·6 claims
- 0474US6835576B2Magnetic thin film, a magnetic component that uses this magnetic thin film, manufacturing methods for the same, and a power conversion deviceFUJI ELECTRIC CO LTD·Filed 2001·Granted Dec 28, 2004·20 cites·7 claims
- 0571US5631524ASwitching apparatusFUJI ELECTRIC CO LTD·Filed 1994·Granted May 20, 1997·29 cites·4 claims
- 0671US5499535APressure sensor and temperature sensorFUJI ELECTRIC CO LTD·Filed 1995·Granted Mar 19, 1996·33 cites·6 claims
- 0770US7687385B2Semiconductor device exhibiting a high breakdown voltage and the method of manufacturing the sameFUJI ELECTRIC HOLDINGS·Filed 2007·Granted Mar 30, 2010·2 cites·7 claims
- 0869US5503034AForce sensor, temperature sensor and temperature/force sensor deviceFUJI ELECTRIC CO LTD·Filed 1993·Granted Apr 2, 1996·31 cites·18 claims
- 0963US8435888B2Semiconductor device and the method of manufacturing the sameSASAKI KOJI·Filed 2011·Granted May 7, 2013·1 cites·5 claims
- 1062US6853034B2Semiconductor device exhibiting a high breakdown voltage and the method of manufacturing the sameFUJI ELECTRIC CO LTD·Filed 2001·Granted Feb 8, 2005·6 cites·7 claims
- 1161US5793153AField emission type electron emitting device with convex insulating portionsFUJI ELECTRIC CO LTD·Filed 1995·Granted Aug 11, 1998·14 cites·18 claims
- 1260US8102050B2Semiconductor device and the method of manufacturing the sameSASAKI KOJI·Filed 2008·Granted Jan 24, 2012·1 cites·5 claims
- 1359US5463226AElectromagnetic wave detecting apparatusFUJI ELECTRIC CO LTD·Filed 1994·Granted Oct 31, 1995·13 cites·5 claims
- 1458US4737923AType arrangement data editing apparatusHITACHI KOKI KK·Filed 1983·Granted Apr 12, 1988·15 cites·5 claims
- 1557US5492011AAcceleration sensorFUJI ELECTRIC CO LTD·Filed 1995·Granted Feb 20, 1996·18 cites·5 claims
- 1655US5631491ALateral semiconductor device and method of fixing potential of the sameFUJI ELECTRIC CO LTD·Filed 1995·Granted May 20, 1997·13 cites·7 claims
- 1751US7195980B2Semiconductor device exhibiting a high breakdown voltage and the method of manufacturing the sameFUJI ELECTRIC CO LTD·Filed 2005·Granted Mar 27, 2007·0 cites·9 claims
- 1851US4851889AInsulated gate field effect transistor with vertical channelFUJI ELECTRIC CO LTD·Filed 1987·Granted Jul 25, 1989·13 cites·1 claims
- 1949US5576986AMemory device using micro vacuum tubeFUJI ELECTRIC CO LTD·Filed 1994·Granted Nov 19, 1996·14 cites·8 claims
- 2045US4286517APrinter magnetic interference prevention systemHITACHI KOKI KK·Filed 1979·Granted Sep 1, 1981·4 cites·7 claims
- 2144US4236447APrinting column number limiting deviceHITACHI KOKI KK·Filed 1978·Granted Dec 2, 1980·4 cites·8 claims
- 2242US5866438AField emission type electron emitting device and method of producing the sameFUJI ELECTRIC CO LTD·Filed 1998·Granted Feb 2, 1999·5 cites·12 claims
- 2339US5381033ADielectrics dividing waferFUJI ELECTRIC CO LTD·Filed 1994·Granted Jan 10, 1995·8 cites·2 claims
- 2439US2005094302A1Magnetic thin film, magnetic component that uses this magnetic thin film, manufacturing methods for the same, and a power conversion deviceFUJI ELECTRIC CO LTD·Filed 2004·Application pending·0 cites
- 2536US5509309AAcceleration measuring deviceFUJI ELECTRIC CO LTD·Filed 1994·Granted Apr 23, 1996·5 cites·20 claims
- 2633US5496760AMethod for manufacturing dielectrics dividing wafer with isolated regionsFUJI ELECTRIC CO LTD·Filed 1994·Granted Mar 5, 1996·4 cites·1 claims
- 2731US5789782ALateral semiconductor device with maximized breakdown voltage, and methods of fixing potential of sameFUJI ELECTRIC CO LTD·Filed 1997·Granted Aug 4, 1998·0 cites·6 claims
- 2831US5592081AMagnetic SensorFUJI ELECTRIC CO LTD·Filed 1995·Granted Jan 7, 1997·2 cites·18 claims
- 2929US2003003699A1High withstand voltage semiconductor device and method of manufacturing the sameFiled 2002·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →