Inventor · disambiguated record
Momoyo Enyama
Also filed as: ENYAMA MOMOYO
33 granted patents·6 pending applications·150 citations·filing 2006–2025
95Inventor score
Top patents by PatentIndex Score
39 records- 0195US8350214B2Charged particle beam applied apparatusHITACHI HIGH TECH CORP·Filed 2010·Granted Jan 8, 2013·88 cites·17 claims
- 0290US7504624B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2006·Granted Mar 17, 2009·13 cites·20 claims
- 0388US10037866B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2016·Granted Jul 31, 2018·5 cites·14 claims
- 0487US9704687B2Charged particle beam application deviceHITACHI HIGH TECH CORP·Filed 2015·Granted Jul 11, 2017·5 cites·9 claims
- 0587US8330103B2Charged particle beam apparatus and specimen inspection methodENYAMA MOMOYO·Filed 2008·Granted Dec 11, 2012·13 cites·17 claims
- 0684US11177108B2Charged particle beam application apparatusHITACHI HIGH TECH CORP·Filed 2018·Granted Nov 16, 2021·4 cites·15 claims
- 0783US11251011B2Electron microscopeHITACHI HIGH TECH CORP·Filed 2016·Granted Feb 15, 2022·3 cites·8 claims
- 0881US8592776B2Charged particle beam apparatusENYAMA MOMOYO·Filed 2009·Granted Nov 26, 2013·6 cites·10 claims
- 0979US9653256B2Charged particle-beam deviceHITACHI HIGH TECH CORP·Filed 2014·Granted May 16, 2017·4 cites·12 claims
- 1074US7755776B2Inspection system and inspection methodHITACHI HIGH TECH CORP·Filed 2007·Granted Jul 13, 2010·3 cites·9 claims
- 1171US8907278B2Charged particle beam applied apparatus, and irradiation methodENYAMA MOMOYO·Filed 2011·Granted Dec 9, 2014·3 cites·12 claims
- 1270US8552373B2Charged particle beam device and sample observation methodENYAMA MOMOYO·Filed 2010·Granted Oct 8, 2013·2 cites·20 claims
- 1366US12481142B2Photoelectron emission microscopeHITACHI HIGH TECH CORP·Filed 2023·Granted Nov 25, 2025·0 cites·11 claims
- 1466US10755396B2Image forming apparatusHITACHI LTD·Filed 2018·Granted Aug 25, 2020·1 cites·12 claims
- 1561US12394586B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2019·Granted Aug 19, 2025·0 cites·15 claims
- 1661US2025020604A1Photoelectron emission microscopeHITACHI HIGH TECH CORP·Filed 2024·Application pending·0 cites
- 1760US2025239430A1Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2025·Application pending·0 cites
- 1858US12205790B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2019·Granted Jan 21, 2025·0 cites·10 claims
- 1958US12125667B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2019·Granted Oct 22, 2024·0 cites·10 claims
- 2058US11915903B2Electron beam application apparatusHITACHI HIGH TECH CORP·Filed 2022·Granted Feb 27, 2024·0 cites·14 claims
- 2156US2023071801A1Electron beam application apparatus and inspection methodHITACHI HIGH TECH CORP·Filed 2022·Application pending·0 cites
- 2254US12057288B2Charged particle beam device and inspection methodHITACHI HIGH TECH CORP·Filed 2019·Granted Aug 6, 2024·0 cites·15 claims
- 2352US11170969B2Electron beam observation device, electron beam observation system, and control method of electron beam observation deviceHITACHI HIGH TECH CORP·Filed 2018·Granted Nov 9, 2021·0 cites·16 claims
- 2451US10629405B2Electron beam device and sample inspection methodHITACHI LTD·Filed 2019·Granted Apr 21, 2020·0 cites·13 claims
- 2551US10361063B2Charged particle detector and charged particle beam device using the sameHITACHI LTD·Filed 2018·Granted Jul 23, 2019·0 cites·14 claims
- 2649US12165828B2Electron gun and electron beam application apparatusHITACHI HIGH TECH CORP·Filed 2019·Granted Dec 10, 2024·0 cites·11 claims
- 2749US10319562B2Charged particle beam deviceHITACHI LTD·Filed 2018·Granted Jun 11, 2019·0 cites·11 claims
- 2849US2007181808A1Electron microscope and electron bean inspection system.MURAKOSHI HISAYA·Filed 2007·Application pending·0 cites
- 2948US11791130B2Electron beam observation device, electron beam observation system, and image correcting method and method for calculating correction factor for image correction in electron beam observation deviceHITACHI HIGH TECH CORP·Filed 2019·Granted Oct 17, 2023·0 cites·28 claims
- 3047US10256068B2Charged particle beam apparatusHITACHI LTD·Filed 2017·Granted Apr 9, 2019·0 cites·14 claims
- 3147US9384940B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2013·Granted Jul 5, 2016·0 cites·15 claims
- 3245US11334761B2Information processing system and information processing methodHITACHI LTD·Filed 2019·Granted May 17, 2022·0 cites·15 claims
- 3345US10483083B2Scanning electron microscope and image processing apparatusHITACHI LTD·Filed 2018·Granted Nov 19, 2019·0 cites·15 claims
- 3444US11967482B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2019·Granted Apr 23, 2024·0 cites·4 claims
- 3544US11380518B2Measurement system and method for setting observation conditions of measurement apparatusHITACHI LTD·Filed 2019·Granted Jul 5, 2022·0 cites·14 claims
- 3644US2013248731A1Electron beam apparatus and lens arrayHITACHI HIGH TECH CORP·Filed 2013·Application pending·0 cites
- 3743US2020225175A1Analyzing systemHITACHI LTD·Filed 2018·Application pending·0 cites
- 3842US10651004B2Charged particle beam deviceHITACHI LTD·Filed 2016·Granted May 12, 2020·0 cites·14 claims
- 3936US9991088B2Charged particle beam device and aberration correctorHITACHI LTD·Filed 2015·Granted Jun 5, 2018·0 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →